Get your FREE copy of the Woollam Newsletter
Find out how you can obtain your own free copy of the latest J. A Woollam newsletter. Highlights include QD Europe as the featured international rep.
Find out how you can obtain your own free copy of the latest J. A Woollam newsletter. Highlights include QD Europe as the featured international rep.
We are offering an ex demonstration model of the J A Woollam AlphaSE Spectroscopic Ellipsometer with a discount and a two year warranty included in the deal.
Case study featuring a J A Woollam Infrared Variable Angle Spectroscopic Ellipsometer (Mark II) provided by Quantum Design UK and Ireland to Nottingham Trent University and the Medical Technologies
A round up of images and testimonials in tis review of our latest Ellipsometry events – the annual Woollam Workshop and CompleteEase Course 2022
To benefit the life and semiconductor market sectors and research labs, and to accelerate the development of new, innovative technologies The partnership agreement between Quantum Design, UK and Ir
We are offering an ex demonstration model of the J A Woollam AlphaSE Spectroscopic Ellipsometer with a discount of 15% and a two year warranty included in the deal.
The theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact package at an affordable price. Here
We were thrilled recently, when our longstanding friend and customer, Professor Joseph Keddie (Physics Department, University of Surrey), agreed to take part in our company video See what he had to
Read about our recent Woollam Workshop and CompleteEase software course – the 21st annual event of its kind. We have feedback from attendees and more information.
We bring you our first company magazine, including our product ranges, interviews, case studies, applications, new product launches and more.
Quantum Design UK and Ireland (QDUKI), in collaboration with the Medical Technologies Innovation Facility (MTIF) and Nottingham Trent University are proud to present this case study from the iSMART
Agreement will aim to benefit the life science and semiconductor market sectors and research labs to accelerate the development of new innovative technologies.
A tutorial from J A Woollam on Ellipsometry Data analysis.
A simple, low cost system for measuring index and thickness with a spectral range of 380-900 nm For routine measurements of thin film thickness and refractive index, the alpha-SE ellipsometer allow
Mueller matrix ellipsometry is one of the hottest topics in the ellipsometry field. Just like “standard ellipsometry”, this non-destructive, optical characterisation technique measures the chan
Watch the recording now! Ellipsometric porosimetry is a non-destructive method to determine characteristics of porous thin-film samples. J A Woollam invites you to this webinar on Tuesday 23 June 2
Attendees at the latest annual Woollam Workshop and CompleteEase Course gave the workshop an overall score of 88.6%. The demonstrations scored particularly highly. Hosting the workshop and course w
J A Woollam’s NEW theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact packag
New features for the leading data analysis platform NEW! Push-Button Analysis Tools CompleteEASE has always included pre-built models that enable push-button analysis of transparent films. We’ve