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Spectroscopic Ellipsometry is being used in all sorts of cutting edge applications, because it can measure most material types: dielectrics, semiconductors, metals, superconductors, organics, biolo
In situ spectroscopic ellipsometry has become a vital tool for monitoring and studying ALD film growth (and even etch) in real time. The combination of ALD and spectroscopic ellipsometry (SE) is pa
Find out how you can obtain your own free copy of the latest J. A Woollam newsletter. Highlights include QD Europe as the featured international rep.
Spectroscopic Ellipsometry updates and news from our partners at J. A. Woollam. Including app notes, videos and workshop reviews.
