24th Annual J. A. Woollam Spectroscopic Ellipsometry Workshop 🗓 🗺
This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry.
This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry.
IXRF Systems’ Bryan DeVerse looks at spatial resolution in elemental analysis and how microXRF spectrometers enhance our understanding of diverse samples.
We bring you our first company magazine, including our product ranges, interviews, case studies, applications, new product launches and more.
Agreement will aim to benefit the life science and semiconductor market sectors and research labs to accelerate the development of new innovative technologies.