Electronic Failure Analysis Magazine
Free magazine on high-tech instrumentation for electronic failure analysis. Case study, app notes, new products and more
Free magazine on high-tech instrumentation for electronic failure analysis. Case study, app notes, new products and more
By adopting cutting-edge production techniques and quality control measures, manufacturers can stay ahead in the market and deliver products that meet the evolving expectations of modern consumers.
Quantum Design UK and Ireland proudly present this inaugural issue of our magazine, dedicated to showcasing the forefront of high-tech scientific instrumentation for life science and biomedical res
Discover FusionScope’s self-sensing cantilevers—offering high-quality, low-noise surface measurements with minimal downtime. Enjoy effortless repeatability, seamless AFM-SEM integration, and ad
Combining Atomic Force Microscopy (AFM), Scanning Electron Microscopy
(SEM), and micromanipulators offers a synergistic approach to material characterisation and
nanoscale analysis.
By combining the complementary strengths of SEM and AFM, FusionScope opens the door to a whole world of new application possibilities. Including failure analysis and quality control procedures.
Join QD Microscopy and Kleindiek as they discuss integrating the correlative Microscopy platform with micromanipulators.
New Publication featuring QD Microscopy’s AFSEM – “Development of Transparent Touch Sensor on Reconstituted Veneers”
A Quantum Design China customer utilised the FusionScope in a recently published research article for in situ real-space observation of the self-restoration behaviour of wrinkles in ferroelectric m
New App note on nanoscale magnetic domains, titled “Magnetic Imaging with FusionScope®”
High-performance tool materials, such as WC-Co composites, play a pivotal role in demanding industrial applications, ranging from machining to aerospace.
Stay ahead of the curve — dive into High-Tech Instrumentation magazine and explore how today’s instruments are solving tomorrow’s challenges.
SEM-XRF : Integrated e⁻Beam / X-ray XRF Elemental Analysis – X-ray Sources for Electron Microscopy (SEM). microXRF is completely non-destructive and does not require the sample to be coated
All the latest on our unique correlative microscopy platform – including an interview, new images, and nanoparticles…
Join QDUKI at Leeds University in January 2025, to discuss Electron Microscopy and Optical Microscopy from our partners NanoMEGAS and Molecular Vista, as well as our FusionScope platform.
Dr. Jiahui Qi of the University of Sheffield has written a case study for us, detailing the Advanced Tribology and Wear Research at the University.
A review of the 2024 Quantum Design Materials Characterisation Workshop “From the Bulk to the Nanoscale”. Held this year at Rutherford Appleton Laboratories. See photos and reviews from
Identify precise orientation texture between ZnO substrate – sexipephenyl (6P) – ZnO deposited layer at nm scale. App note on hybrid inorganic/organic systems for optoelectronics in dai
The scaling required to reach faster chip performances in electronic devices has pushed the dimensions of copper interconnect (CI) lines to the nanometer domain. This app note explores this more
During this interview at M&M 2024, QD’s Rick Hapanowicz details three NEW and exciting features on the FusionScope correlative AFM and SEM…