Electron Microscopy
SEM, TEM, Electron Diffraction and In-Situ Electron Microscopy
Electron Microscopy (EM) is a microscope technique that uses a beam of electrons to produce high resolution imagery.
Electron microscopy (EM) encompasses a suite of advanced techniques that use focused electron beams to generate high-resolution images and analytical data at the micro- and nanoscale. The solutions offered by QD UK provide a comprehensive portfolio designed to enhance both imaging and material characterisation across a wide range of scientific and industrial applications. These systems are compatible with major scanning electron microscopes (SEM) and transmission electron microscopes (TEM), and are supported by integrated software for data acquisition and analysis.
Key products include correlative platforms such as the FusionScope, which combine atomic force microscopy (AFM) with SEM to deliver simultaneous structural, mechanical, electrical, and magnetic insights. This enables advanced workflows such as nanostructure characterisation, semiconductor failure analysis, and high-precision quality control. Other solutions, such as the AFSEM®nano, extend nanoscale measurement capabilities directly within the SEM environment Also available is the world’s only dedicated horizontal electron diffractometer, the ELDICO ED-1. The device is dedicated solely to electron diffraction (ED, also known as 3D-ED, microED or electron diffraction tomography). It is a user-friendly device that investigates crystalline samples with particle sizes below 1000 nm.
The beam Precession in Transmission Electron Microscopes (TEMs) is a well-known technique to enhance dramatically the quality of the electron diffraction patterns, mitigating dynamical effect, increasing dps resolution, enhancing bending and thickness effect, etc. Based on Precession Electron Diffraction (PED), NanoMEGAS offers several exciting unique, automated and robust applications.
Analytical enhancements including SEM-EDS and SEM-XRF systems from IXRF Systems further expand elemental analysis capabilities, offering high sensitivity, non-destructive testing, and trace-level detection with ppm accuracy. These technologies support applications in materials science, electronics, metallurgy, and advanced manufacturing, providing researchers and engineers with powerful tools to investigate composition, structure, and performance at unprecedented resolution.
Our team has many years of experience in Electron Microscopy applications and we can discuss with you your research needs and provide the best solution to match your experiment. All of our products are compatible with the major Electron Microscopy manufacturers and are provided with software to collect and analyse your data.
