A simple, low cost system for measuring index and thickness with a spectral range of 380-900 nm For routine measurements of thin film thickness and refractive index, the alpha-SE ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. We are inviting you […]
Now in webinar format We are celebrating 20 years of Spectroscopic Ellipsometry workshops with our partners, J A Woollam. This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the workshop will include an introduction, fundamentals of ellipsometric data analysis, and an overview […]
This course has now been changed to an online course. Find out more
Bulk and Thin Film Characterisation Beyond Standard FTIR Spectroscopy Watch the recording now For more than 23 years the J. A. Woollam IR-VASE®, FTIR-based ellipsometer (covering 1.7 to 30 µm wavelengths) has been used to study mid- and far-IR optical coatings and devices, semiconductors, photovoltaics, surface chemistry, and other applications. In contrast to standard FTIR […]
Mueller matrix ellipsometry is one of the hottest topics in the ellipsometry field. Just like “standard ellipsometry”, this non-destructive, optical characterisation technique measures the change of polarisation of light upon reflection from or transmission through a sample. However, Mueller matrix ellipsometry is not limited to measuring isotropic samples where film thickness and optical constants are […]
Watch the recording now! Ellipsometric porosimetry is a non-destructive method to determine characteristics of porous thin-film samples. J A Woollam invites you to this webinar on Tuesday 23 June 2020 at 7pm BST.
We thought we’d make it easy for you to watch some of our latest webinars, so here is a round up of ones you catch watch right now and also book in for future planned webinars and online events.
Attendees at the latest annual Woollam Workshop and CompleteEase Course gave the workshop an overall score of 88.6%. The demonstrations scored particularly highly. Hosting the workshop and course were: Shayz Ikram, Quantum Design UK and Ireland Andrew Martin , J A Woollam Company Jeremy Van Derslice, J A Woollam Company For the 19th year running, […]
J A Woollam’s NEW theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact package at an affordable price. A introduction and overview of the NEW theta-SE Ellipsometer will be given at our J A Woollam Spectroscopic Ellipsometry Workshop which is being held at the National Physical Laboratory […]
New features for the leading data analysis platform NEW! Push-Button Analysis Tools CompleteEASE has always included pre-built models that enable push-button analysis of transparent films. We’ve recently simplified the analysis procedure for semi-absorbing films by automating the B-spline layer. B-spline automation is done by pre-configuring the following parameters that previously required extensive user input: • […]