Book your alpha-SE ellipsometer online demo now!

A simple, low cost system for measuring index and thickness with a spectral range of 380-900 nm For routine measurements of thin film thickness and refractive index, the alpha-SE ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. We are inviting you […]

Posted on Wednesday, June 24th, 2020

Ellipsometers News # # #

J A Woollam CompleteEase Software Training Course 2020 – changed to online course 🗓

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Ellipsometers Events Recordings Webinars

This course has now been changed to an online course. Find out more

Posted on Friday, May 22nd, 2020

Ellipsometers Events Recordings Webinars # # #

Watch Now: Spectroscopic Ellipsometer Online Workshop 🗓

Ellipsometers Events Recordings Spectroscopy Webinars

We are celebrating 20 years of Spectroscopic Ellipsometry workshops.

Posted on Wednesday, May 20th, 2020

Ellipsometers Events Recordings Spectroscopy Webinars # # #

Watch Now: Infrared Ellipsometry Webinar 🗓

Ellipsometers Events Recordings Webinars

Bulk and Thin Film Characterisation Beyond Standard FTIR Spectroscopy

Posted on Sunday, May 17th, 2020

Ellipsometers Events Recordings Webinars # # #

Mueller Matrix Ellipsometry – A Universal Optical Characterisation Technique

Mueller matrix ellipsometry is one of the hottest topics in the ellipsometry field. Just like “standard ellipsometry”, this non-destructive, optical characterisation technique measures the change of polarisation of light upon reflection from or transmission through a sample. However, Mueller matrix ellipsometry is not limited to measuring isotropic samples where film thickness and optical constants are […]

Posted on Saturday, May 16th, 2020

Ellipsometers News Recordings Webinars # # # #

Ellipsometric Porosimetry Webinar 🗓

Ellipsometers Recordings Webinars

Watch the recording now! Ellipsometric porosimetry is a non-destructive method to determine characteristics of porous thin-film samples. J A Woollam invites you to this webinar on Tuesday 23 June 2020 at 7pm BST.

Posted on Friday, May 15th, 2020

Ellipsometers Recordings Webinars # # #

Webinar round up

We thought we’d make it easy for you to watch some of our latest webinars, so here is a round up of ones you catch watch right now and also book in for future planned webinars and online events.

Posted on Wednesday, May 13th, 2020

Cryogenics and Optical Cryostats Electron Microscopy Ellipsometers Imaging Cameras Lake Shore News # # # #

Feedback from the 19th Annual Woollam Workshop & CompleteEase Course

Attendees at the latest annual Woollam Workshop and CompleteEase Course gave the workshop an overall score of 88.6%. The demonstrations scored particularly highly. Hosting the workshop and course were: Shayz Ikram, Quantum Design UK and Ireland Andrew Martin , J A Woollam Company Jeremy Van Derslice, J A Woollam Company For the 19th year running, […]

Posted on Thursday, October 31st, 2019

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J A Woollam launch the NEW theta-SE Ellipsometer

J A Woollam’s NEW theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact package at an affordable price. A introduction and overview of the NEW theta-SE Ellipsometer will be given at our J A Woollam Spectroscopic Ellipsometry Workshop which is being held at the National Physical Laboratory […]

Posted on Monday, July 8th, 2019

Ellipsometers News # # #

J A Woollam Software Update: CompleteEase 6

New features for the leading data analysis platform NEW! Push-Button Analysis Tools CompleteEASE has always included pre-built models that enable push-button analysis of transparent films. We’ve recently simplified the analysis procedure for semi-absorbing films by automating the B-spline layer. B-spline automation is done by pre-configuring the following parameters that previously required extensive user input: • […]

Posted on Wednesday, January 2nd, 2019

Ellipsometers News # #

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