OFFER: Ex-Demo alphaSE Spectroscopic Ellipsometer
We are offering an ex demonstration model of the J A Woollam alphaSE Spectroscopic Ellipsometer with a great discount and a two year warranty included in the deal.
We are offering an ex demonstration model of the J A Woollam alphaSE Spectroscopic Ellipsometer with a great discount and a two year warranty included in the deal.
Join us at Rideal Lecture and Symposium Polymer Colloids, where we will be honouring our friend, Prof. Joe Kiddie who is 2026’s awardee.
Woollam offers spectroscopic ellipsometers that cover broad wavelength ranges and support a variety of sample types — from dielectrics and semiconductors to metals, multilayers and complex stacks
Free magazine on high-tech instrumentation for electronic failure analysis. Case study, app notes, new products and more
Quantum Design UK and Ireland proudly present this inaugural issue of our magazine, dedicated to showcasing the forefront of high-tech scientific instrumentation for life science and biomedical res
We recently held our 25th Annual J. A. Woollam Spectroscopic Ellipsometry Workshop and CompleteEASE software course. See the reviews, photos and testimonials from attendees.
Learn how Boston Scientific in Ireland developed a recipe for ALD film deposition on implantable devices.
Free magazine dedicated to high-tech instrumentation for aerospace applications from Quantum Design UK and Ireland
Discover how the Tyndall National Institute in Cork uses spectroscopic ellipsometry in their research.
The IR-VASE II ellipsometer enables precise, non-destructive measurement of stealth coatings by characterising optical properties across the IR spectrum—crucial for reducing infrared detectabilit
Read the latest edition of the newsletter from J. A. Woollam, the leaders in spectroscopic ellipsometry for almost 40 years.
Using spectroscopic ellipsometry to find materials to make displays and touchscreens function well and consistently.
Spectroscopic Ellipsometry is being used in all sorts of cutting edge applications, because it can measure most material types: dielectrics, semiconductors, metals, superconductors, organics, biolo
In situ spectroscopic ellipsometry has become a vital tool for monitoring and studying ALD film growth (and even etch) in real time. The combination of ALD and spectroscopic ellipsometry (SE) is pa
We recently held our 24th Annual J. A. Woollam Spectroscopic Ellipsometry Workshop and CompleteEASE software course. See the reviews, photos and testimonials from attendees.
J. A. Woollam introduces the alpha 2.0, the second generation of the alpha-SE. The alpha 2.0 is a budget-friendly option for routine measurements of thin film thickness and refractive index.
Find out how you can obtain your own free copy of the latest J. A Woollam newsletter. Highlights include QD Europe as the featured international rep.
QDUKI looks back at 2023, with events, magazines, new staff and workshop reviews. We also have detailed listings of our opening times over Christmas and the new year.
QDUKI present the latest of our FREE magazines – this time we’re covering the hot topic ‘Semiconductors’. Our products are playing a critical role in this growth industry in
Spectroscopic Ellipsometry updates and news from our partners at J. A. Woollam. Including app notes, videos and workshop reviews.