Nanomegas DigiSTAR 3D Diffraction Topography

3D Precession Topography

3D Precession Topography is the structure of complex nanocrystalline structures which can be solved ab-initio with precession electron diffraction.

DigiSTAR-precession electron diffraction (PED) device enables the collection of quasi-kinematical intensities (X-Ray like) in any TEM.  PED in combination with powerful software (3D difffraction tomography) enables the reconstruction of the reciprocal  cell of any nanomaterial and the automatic measurement of the reflection intensities. 

DigiSTAR can be easily retrofitted into various TEM in the same laboratory and can upgrade /enhance TEM functionalities for electron crystallography.

In this way you can use your TEM as a powerful tool to solve any nanocrystal structure with performance comparable to the most advanced Synchrotron beamlines

FEATURES:

  • DigiSTAR digital precession electron diffraction unit is easily retrofit to any TEM 100-300 KV (LaB6 /W – FEG), alignments are stored in memory
  • Ab-initio structure determination of (any nanostructure) metals, ceramics, polymers, semiconductors, pharmaceuticals using precession electron diffraction intensities
  • Precession semi-angle variable from 0- 85 mrad (TEM dependent), spot distortion correction-compensation at high angles ( > 15 mrad )
  • Precession frequency variable from 0.3-2.3 kHz (TEM dependent), suitable for beam sensitive  samples
  • Easy symmetry determination for nanocrystals (space and point group)
  • Accurate stoichiometry refinement for nanostructures
  • DigiSTAR can be easily retrofitted into various TEM in the same laboratory and can upgrade /enhance TEM functionalities for electron crystallography

Dr Shayz Ikram

Technical Director
tel:+44 (0)1372 378822
shayz@qd-uki.co.uk

MODELS

The new Digistar has been completely redesigned from 1st principles resulting in low distortion lower emissions product with full NRTL certification. Additional external synchronisation outputs have been added for hardware synchronising with on column accessories such as cameras and detectors. The standard installation now supports a distance of 10 m from the column with extension options available for remote installations up to 30 m. The new Digistar comes complete with 14 core IE9 processors and 32 GB of RAM with options of upgrading to 128 GB of RAM.

OPTIONS

3D Precession Topography is the structure of complex nanocrystalline structures which can be solved ab-initio with precession electron diffraction.

DigiSTAR-precession electron diffraction (PED) device enables the collection of quasi-kinematical intensities (X-Ray like) in any TEM.  PED in combination with powerful software (3D difffraction tomography) enables the reconstruction of the reciprocal  cell of any nanomaterial and the automatic measurement of the reflection intensities.

FEATURES:

  • Compatible with any TEM
  • Diffraction data collection with any CCD cameras
  • Includes software

ASTAR can turn any TEM into a very powerful analytical tool enabling orientation– phase imaging at 1 nm resolution attainable (FEG TEM) in combination with other TEM analytical techniques. In combination with TOPSPIN simultaneous orientation/phase/strain /STEM maps are possible.

APPLICATIONS INCLUDE:
Materials Science
Texture of metals is linked to specific physical properties so the need to characterise it at nm scale with novel ASTAR orientation imaging technique.

Semiconductors
Faster chip performances in electronic devices push copper interconnects at < 3  nm  scale, so the need for novel TEM  based  texture ASTAR characterisation technique.  Plasticity mechanism studies of freestanding Pd-films with nanoscale twins.

Nanoparticles
Nanoparticle crystal structure and texture are very important for drug delivery and catalysis properties and need novel TEM characterisation techniques.

Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based on nanobeam precession diffraction patterns in combination with DigiSTAR. Precision up to 0.02% (200kV FEG) with spatial resolution up to 2nm attainable (FEG-TEM).

FEATURES

  • High spatial resolution, high precision strain mapping in modern semiconductor devices
  • Acquisition of STEM reference image
  • Ultra-fast nanobeam precession electron diffraction scanned acquisition
  • Typical acquisition time: 5-10 min (150×150)
  • Time per pixel: 10-40 ms Analysis time 5-10 min
  • Automated local strain analysis via AppFive proprietary algorithm
  • Acquisition from individual positions, line profiles, areas
  • Spatial resolution < 2 nm attainable (FEG TEM)
  • Monitor engineered strain distributions in modern semiconductor devices
  • Expected sensitivity: < 2 x 10-4
  • Intuitive workflow

In combination with TOPSPIN simultaneous orientation/ phase/strain/STEM maps are possible.

Beam Precession in EELS & EDX spectroscopy enhance the signal reducing channelling effects. Automated quantification with statistical error analysis is available. Multiple scattering derived from an automatically measured relative thickness.

  • Highly-automated EELS elemental analysis
  • Minimal user input required
  • Specify elements to quantify
  • Chemical shift of each elemental edge
  • Automated quantification with statistical error analysis
  • Multiple scattering derived from an automatically measured relative thickness
  • Elemental core-loss edges from several possible sources:
  • Theoretical : Hartree-Slater (Rez)
  • Experimental edges from reference materials
  • Intuitive workflowv

Beam Precession in EELS & EDX spectroscopy enhance the signal reducing channelling effects. Automated quantification with statistical error analysis is available. Multiple scattering derived from an automatically measured relative thickness.

  • Highly-automated EELS elemental analysis
  • Minimal user input required
  • Specify elements to quantify
  • Chemical shift of each elemental edge
  • Automated quantification with statistical error analysis
  • Multiple scattering derived from an automatically measured relative thickness
  • Elemental core-loss edges from several possible sources:
  • Theoretical : Hartree-Slater (Rez)
  • Experimental edges from reference materials
  • Intuitive workflow

Topspin is a digital STEM, Beam Precession and Analytical Experiment Framework offering a suite of beam precession-enabled imaging and advanced analytical experiments.

Turn-key Solution (Hardware & Experiments) that upgrades your STEM to enable new advanced experiments enabled by Precession Electron Diffraction Scanned Acquisition in combination with DigiSTAR.

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