Keep up to date with our latest product news, events and developments:
Woollam offers spectroscopic ellipsometers that cover broad wavelength ranges and support a variety of sample types — from dielectrics and semiconductors to metals, multilayers and complex stacks
Discover how the Tyndall National Institute in Cork uses spectroscopic ellipsometry in their research.
Spectroscopic Ellipsometry is being used in all sorts of cutting edge applications, because it can measure most material types: dielectrics, semiconductors, metals, superconductors, organics, biolo
In situ spectroscopic ellipsometry has become a vital tool for monitoring and studying ALD film growth (and even etch) in real time. The combination of ALD and spectroscopic ellipsometry (SE) is pa
The J A Woollam Spectrosopic Ellipsometry workshop took place on Monday 13 September at the MTIF Facility at Nottingham Trent University. We were very excited to announce the line up of speakers: U
Seeking to better understand the optical and electronic properties of materials or thin films for nanophotonic or electronic applications? We recently announced our partnership with Medical Technol
A tutorial from J A Woollam on Ellipsometry Data analysis.
A simple, low cost system for measuring index and thickness with a spectral range of 380-900 nm For routine measurements of thin film thickness and refractive index, the alpha-SE ellipsometer allow
Mueller matrix ellipsometry is one of the hottest topics in the ellipsometry field. Just like “standard ellipsometry”, this non-destructive, optical characterisation technique measures the chan
Watch the recording now! Ellipsometric porosimetry is a non-destructive method to determine characteristics of porous thin-film samples. J A Woollam invites you to this webinar on Tuesday 23 June 2
Attendees at the latest annual Woollam Workshop and CompleteEase Course gave the workshop an overall score of 88.6%. The demonstrations scored particularly highly. Hosting the workshop and course w
J A Woollam’s NEW theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact packag
