X-Ray Systems and Sources

Conduct Breakthrough Research with X-rays

Bringing the Synchrotron to your Lab – Sigray provides a full suite of synchrotron-like systems for everything from compositional analysis & chemical speciation to 3D microstructure.

X-ray Absorption Spectroscopy (XAS)

X-ray absorption spectroscopy (XAS) is a chemical state analysis technique used for research in a broad range of disciplines. This technique involves measuring the transmission (or fluorescence) of x-rays as a function of incrementing x-ray energy in small steps at energies close to the absorption edge. The absorption edge energy corresponds to the energy required to eject an electron from an electron shell) of an element of interest (e.g. Fe). Small changes in how x-rays are absorbed near an atom’s absorption edge provide insight into the state of the electrons.

XAS is comprised of two regions:

  • X-ray absorption near edge structure (XANES/NEXAFS): Comprising x-ray energies nearest to the absorption edge (~100 eV around the edge), this region exhibits sharp resonance peaks. Generally, the region is sensitive to local atomic states such as oxidation states and symmetry.
  • Extended fine structure (EXAFS): This region contains features appearing after the XANES region and up to ~1000 eV or greater than the absorption edge. EXAFS appears as gentle oscillations in the measured signal and is caused by scattering of the ejected electron by surrounding atoms. EXAFS measurements can be used to measure neighbouring atom information, including bond lengths and chemical coordination environments.
XANES and EXAFS regimes

Sigray produces two laboratory XAS systems, both with capabilities rivalling synchrotron beamlines. The first is the V210, an optics-based transmission XAS with low Z (atomic number) capabilities down to phosphorus and with micro-XAS mapping capabilities at 100 µm spot sizes. The second is the H2000, an XAS system with both transmission and fluorescence XAS capabilities. Both systems offer excellent throughput.


X-ray Fluorescence (XRF) Microscopy

Also known as microXRF, X-ray Fluorescence Microscopy is a powerful spatially-resolved elemental mapping and chemical microanalysis technique. Under x-ray illumination, samples produce characteristic x-rays that can be analysed to determine composition.

MicroXRF advantages include:

  • Higher sensitivity (in comparison to electron-based techniques such as microprobes)
  • Non-destructive for in situ or in operando analysis of elemental migration
  • Simultaneous detection of multiple elements and no sample preparation required

Sigray’s AttoMap microXRF systems come in two types: the ambient AttoMap-200 with ultra large stage travel and the vacuum AttoMap-310 with a goniometer stage for variable x-ray angles of incidence.


3D X-ray Microscopes

Sigray’s 3D X-ray Microscope product family offers the most unique and innovative features on the market. Our turnkey microscopes offer a simple and intuitive experience for beginners while maintaining comprehensive access for power users.

We’re vertically integrated across X-ray source, optics and detector which means we can bring you unique advances available nowhere else.

We produce systems that span spatial resolutions from nanometers to millimetres to provide outstanding flexibility for a wide range of research application interests, including materials science, life science, semiconductor, additive manufacturing and pharmaceuticals.


SEM/EDX Overview

Energy-dispersive spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterisation of a sample. It relies on an interaction of an electron beam (e beam) and a sample within a Scanning Electron Microscope (SEM) instrument. Its characterisation capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing a unique set of peaks on its electromagnetic emission spectrum (which is the main principle of spectroscopy). The peak positions are predicted by the Moseley’s law with accuracy much better than experimental resolution of a typical SEM/EDS or SEM/EDX instrumentation.

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