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InfraTec Electronic / Semiconductor Testing Solution – E-LIT
Modular Automated Test Bench
Automated testing solution system allows non-contact failure inspection of semiconductor material during the manufacturing process. Inhomogeneous temperature distribution, local power loss can be measured with Lock-in Thermography. This is achieved by using the shortest measurement times combined with a high-performance thermographic camera and a specialised lock-in procedure.
Learn more about our demo loans of the InfraTec Image IR Thermography Camera. Rent the camera for your next research project.
The power supply for this process is clocked with a synchronisation module and failures that produce mK or even μK differences are reliably detected.
Smallest defects like point and line shunts, oxide failures, transistor and diode failures on a PCB surface and in IC´s can be detected and displayed in x and y positions. Additionally, it is possible to analyse stacked-die packages or multi-chip modules in z-direction with merely changing the lock-in frequency.
FEATURES:
- Online lock-in measurement with the highest sensitivity
- Complete and detailed microscopy analysis
- Geometrical resolution up to 1.3 μm per pixel with microscope lenses
- Thermal resolution in the microkelvin range
- Multi-layer analysis
- Automatic scanning of larger samples due to precision mechanics
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SPECIFICATIONS
Measuring chamber
| Infrared thermographic camera | High-end camera – ImageIR® or VarioCAM® HD head |
| Detector (cooled) | (1,280 × 1,024) / (640 × 512) IR pixels |
| Detector (uncooled) | (1,024 × 768) / (640 × 480) IR pixels |
| Spectral range | (2 … 5) µm or (7.5 … 14) µm |
| Infrared image frequency | Up to 355 Hz @ (640 × 512) IR pixels |
| Available lenses | 12 mm, 25 mm, 50 mm, close-ups, microscopes 1×, 3×, 8× up to 2 µm per pixel |
| Electrical excitation source | 4 Quadrant power supply or other special power supply e.g. Keithley |
Optional
- X, Y axis sample moving table
- Z axis for camera positioning and focus adaption
- Autofocus for camera
- Contact probes for 4 point measurement
Evaluation unit
| Dimensions | (560 × 670 × 840) mm (W × H × D) |
| PC | 19″ industry PC |
| Power supply | 230 V AC / 110 V AC |
| Weight | 60 kg (incl. PC)* |
Test bench / rollable base
| Dimensions | (1180 × 1280 × 800) mm / (1150 × 750 × 800) mm (B × H × T) |
| Weight | 80 kg / 150 kg |
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Applications
Thermography in Electronics and Electrical Industry
Measure temperature distributions of smallest electronic components with infrared cameras
