A simple, low cost system for measuring index and thickness with a spectral range of 380-900 nm
For routine measurements of thin film thickness and refractive index, the alpha-SE ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds.
We are inviting you to book an exclusive online demonstration with our technical expert, Dr Shayz Ikram to discuss your application in more detail.
SALE OR RETURN OPTION
Plus if you like what you see, we are offering the opportunitiy to purchase the instrument on a sale or return basis.
Please contact Shayz Ikram for more details
Why an alpha-SE?
Push-button operation is complemented by advanced software that takes care of the work for you
Proven spectroscopic ellipsometer technology gives you both thickness and index with much higher certainty than other techniques
Works with your materials – dielectrics, semiconductors, organics, and more
Spectroscopic ellipsometry for simple sample systems
Hundreds of wavelengths simultaneously collected in seconds for immediate results