Keep up to date with our latest product news, events and developments:
Spectroscopic Ellipsometry is being used in all sorts of cutting edge applications, because it can measure most material types: dielectrics, semiconductors, metals, superconductors, organics, biolo
In situ spectroscopic ellipsometry has become a vital tool for monitoring and studying ALD film growth (and even etch) in real time. The combination of ALD and spectroscopic ellipsometry (SE) is pa
The J A Woollam Spectrosopic Ellipsometry workshop took place on Monday 13 September at the MTIF Facility at Nottingham Trent University. We were very excited to announce the line up of speakers: U
Seeking to better understand the optical and electronic properties of materials or thin films for nanophotonic or electronic applications? We recently announced our partnership with Medical Technol
A tutorial from J A Woollam on Ellipsometry Data analysis.
A simple, low cost system for measuring index and thickness with a spectral range of 380-900 nm For routine measurements of thin film thickness and refractive index, the alpha-SE ellipsometer allow
Mueller matrix ellipsometry is one of the hottest topics in the ellipsometry field. Just like “standard ellipsometry”, this non-destructive, optical characterisation technique measures the chan
Watch the recording now! Ellipsometric porosimetry is a non-destructive method to determine characteristics of porous thin-film samples. J A Woollam invites you to this webinar on Tuesday 23 June 2
Attendees at the latest annual Woollam Workshop and CompleteEase Course gave the workshop an overall score of 88.6%. The demonstrations scored particularly highly. Hosting the workshop and course w
J A Woollam’s NEW theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact packag
