NDT Elemental Analysis with a microXRF Spectrometer
SEM-XRF : Integrated e⁻Beam / X-ray XRF Elemental Analysis – X-ray Sources for Electron Microscopy (SEM). microXRF is completely non-destructive and does not require the sample to be coated
Non-Destructive Testing
Pulsed Thermography Applications
Today, pulsed thermography is widely used in the aerospace, power generation and automotive industry sectors all over the world. Much of this success is attributed to TWI’s vision and passion to
Webinar: Thermography Compact 🗓
Join our partners InfraTec for this free online event “Thermography Compact -Enter the world of infrared thermography” on March 26th, 1 – 4 PM. Register today to secure your place
Non-Destructive Testing
Non destructive testing allows you detect flaws, measure thickness, and assess the condition of materials without making contact with, or destroying samples. We offer thermographic NDT with partne
Electronic / Semiconductor Testing Solution – E-LIT
E-LIT – Lock-In Thermography for Electronics is an automated testing solution system (as part of NDT techniques) which allows non-contact (electrical) failure analysis of semiconductor material d
