
Written by: Jeremy Vanderslice, Applications Engineer, J. A. Woollam
Spectroscopic Ellipsometry is being used in all sorts of cutting edge applications. This widespread use is explained by increased dependence on thin films in many areas and the flexibility of ellipsometry to measure most material types: dielectrics, semiconductors, metals, superconductors, organics, biological coatings, and composites of materials.
Virtual and Augmented Reality
There is continued customer demand for integrated devices that provide increased situational awareness within the natural environment and that enable immersive experience for both technical and recreational purposes. Tech innovators are rapidly developing hardware that meet these demands ranging from headsets to integrated, wearable sensors. Ellipsometry is used in the development and production of many of these devices from detecting polarising effects such as birefringence and dichroism to characterisation of anti-reflection coatings, touchscreens, and flexible displays. We are excited to contribute to the development and production of such an exciting and rapidly growing field.

Architectural Glass
Thin film coatings have long been used to improve the thermal and optical properties of glass. Coatings on glass can be designed to change the visual colour of the glass for artistic design, commonly noticed on buildings and skyscrapers around the world. The consistency and uniformity of the coatings are critically important to ensure each pane of glass looks the same. Thin film coatings have also been used to improve the thermal efficiency of buildings. Passive approaches are designed to limit heat flow in or out by limiting the transmission of infrared light. Active technologies are being used that control the transmissibility based on ambient lighting and other factors. Ellipsometers are used in the development of these new styles of coatings while also helping in production to ensure consistency and uniformity across each pane of glass.

Advanced Optics
The James Webb Space Telescope was recently launched into space and features gold-coated beryllium mirrors for imaging infrared signatures of galaxies too distant for Hubble to witness. To detect faint infrared signals, the thermal signature of the telescope must be reduced and thermal radiation from other sources must be blocked. A sunshield was developed to protect Webb from external sources of radiation. The sunshield is composed of a Kapton substrate coated with aluminium and doped-silicon films to reflect incident radiation back into space. Spectroscopic Ellipsometry was used to ensure the film properties meet design specifications for critical components like the sunshield. Ellipsometry is also used to ensure that the optical properties of these specialised coatings enable the telescope to transmit beautiful images back to earth for many years to come.

Biomedical Devices
Medical devices implanted or adhered to the body require specialised coatings to ensure biocompatibility, improve functionality, and increase the lifespan of the device within the body. Coatings are engineered to reduce inflammation caused by the device and therefore reduce the associated risk of infection. Thin-film coatings on these devices have also been designed to improve corrosion resistance caused by interactions with bodily fluids. Many different methods of deposition have been developed to optimise the coatings. Ellipsometry is one form of metrology used in development and quality control of thin-film deposition on bio-implanted or adhered devices. Woollam technology is used to monitor the consistency of the coating as well as ensure its presence on the device.


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Measure your Film Thickness and Optical Constants by Ellipsometry
We offer a wide range of spectroscopic ellipsometers, optimised for your particular application.
Since the 1960s, as ellipsometry developed to provide the sensitivity necessary to measure nanometer-scale layers used in microelectronics, interest in ellipsometry has grown steadily. Today, the range of its applications has spread to the basic research in physical sciences, semiconductor and data storage solutions, flat panel display, communication, biosensor, and optical coating industries.


For more information and to find out how spectroscopic ellipsometry can help with your application, contact our Technical Director, Dr. Shayz Ikram by email below or call (01372) 378822.