Introducing the Latest Edition of High-Tech Instrumentation
Stay ahead of the curve — dive into High-Tech Instrumentation magazine and explore how today’s instruments are solving tomorrow’s challenges.
Semiconductors
Cutting Edge Applications Using Spectroscopic Ellipsometry
Spectroscopic Ellipsometry is being used in all sorts of cutting edge applications, because it can measure most material types: dielectrics, semiconductors, metals, superconductors, organics, biolo
Analyse Electronic Components or Semiconductor Devices Using AFM
By combining the complementary strengths of AFM and SEM, FusionScope opens the door to a world of new semiconductor application possibilities.
Compound Semiconductors
This article discusses electronic transport characterisation of HEMT structures employing variable magnetic field, variable temperature Hall measurements and a mobility spectrum analysis software p
Electronic / Semiconductor Testing Solution – E-LIT
E-LIT – Lock-In Thermography for Electronics is an automated testing solution system (as part of NDT techniques) which allows non-contact (electrical) failure analysis of semiconductor material d
X-rays in Semiconductors
Sigray’s x-ray solutions include 3D x-ray microscopes and microXRF systems in vacuum environments. These systems are used for a range of semiconductor applications, including everything from insp
Theta-SE Ellipsometer for Semiconductors
The theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact package at an affordable price. Here
New Collaboration Between QDUKI and MTIF
Agreement will aim to benefit the life science and semiconductor market sectors and research labs to accelerate the development of new innovative technologies.
