When Ellipsometry Works Best: A Case Study With Transparent Conductive Oxides
Case study using the J. A. Woollam Mark II IR Variable Angle Spectroscopic Ellipsometry (VASE)
Case study using the J. A. Woollam Mark II IR Variable Angle Spectroscopic Ellipsometry (VASE)
Agreement will aim to benefit the life science and semiconductor market sectors and research labs to accelerate the development of new innovative technologies.
A tutorial from J A Woollam on Ellipsometry Data analysis.
A simple, low cost system for measuring index and thickness with a spectral range of 380-900 nm For routine measurements of thin film thickness and refractive index, the alpha-SE ellipsometer allow
Mueller matrix ellipsometry is one of the hottest topics in the ellipsometry field. Just like “standard ellipsometry”, this non-destructive, optical characterisation technique measures the chan
Watch the recording now! Ellipsometric porosimetry is a non-destructive method to determine characteristics of porous thin-film samples. J A Woollam invites you to this webinar on Tuesday 23 June 2
We thought we’d make it easy for you to watch some of our latest webinars, so here is a round up of ones you catch watch right now and also book in for future planned webinars and online even
Attendees at the latest annual Woollam Workshop and CompleteEase Course gave the workshop an overall score of 88.6%. The demonstrations scored particularly highly. Hosting the workshop and course w
J A Woollam’s NEW theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact packag
New features for the leading data analysis platform NEW! Push-Button Analysis Tools CompleteEASE has always included pre-built models that enable push-button analysis of transparent films. We’ve