Free High-Tech Instrumentation Magazine
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Ellipsometers
Watch: QD-UKI Company Video
Launching our company video – featuring staff, customers, suppliers and products. Get a feel for us as a company. Watch interviews with suppliers, staff and customers.
Meet the speakers at the J A Woollam Spectroscopic Ellipsometry Workshop
The J A Woollam Spectrosopic Ellipsometry workshop took place on Monday 13 September at the MTIF Facility at Nottingham Trent University. We were very excited to announce the line up of speakers: U
Bespoke One-Off Ellipsometer Measurements
Seeking to better understand the optical and electronic properties of materials or thin films for nanophotonic or electronic applications? We recently announced our partnership with Medical Technol
Case Study: iSMART Research Group and Woollam IR-Vase II
Quantum Design UK and Ireland (QDUKI), in collaboration with the Medical Technologies Innovation Facility (MTIF) and Nottingham Trent University are proud to present this case study from the iSMART
When Ellipsometry Works Best: A Case Study With Transparent Conductive Oxides
Case study using the J. A. Woollam Mark II IR Variable Angle Spectroscopic Ellipsometry (VASE)
New Collaboration Between QDUKI and MTIF
Agreement will aim to benefit the life science and semiconductor market sectors and research labs to accelerate the development of new innovative technologies.
Ellipsometry Data Analysis
A tutorial from J A Woollam on Ellipsometry Data analysis.
Book your alpha-SE ellipsometer online demo now!
A simple, low cost system for measuring index and thickness with a spectral range of 380-900 nm For routine measurements of thin film thickness and refractive index, the alpha-SE ellipsometer allow
Mueller Matrix Ellipsometry – A Universal Optical Characterisation Technique
Mueller matrix ellipsometry is one of the hottest topics in the ellipsometry field. Just like “standard ellipsometry”, this non-destructive, optical characterisation technique measures the chan
Watch the recording now! Ellipsometric porosimetry is a non-destructive method to determine characteristics of porous thin-film samples. J A Woollam invites you to this webinar on Tuesday 23 June 2
Webinar round up
We thought we’d make it easy for you to watch some of our latest webinars, so here is a round up of ones you catch watch right now and also book in for future planned webinars and online even
Feedback from the 19th Annual Woollam Workshop & CompleteEase Course
Attendees at the latest annual Woollam Workshop and CompleteEase Course gave the workshop an overall score of 88.6%. The demonstrations scored particularly highly. Hosting the workshop and course w
J A Woollam launch the NEW theta-SE Ellipsometer
J A Woollam’s NEW theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact packag
J A Woollam Software Update: CompleteEase 6
New features for the leading data analysis platform NEW! Push-Button Analysis Tools CompleteEASE has always included pre-built models that enable push-button analysis of transparent films. We’ve
