Magazine: High Tech Instrumentation for Semiconductors
QDUKI present the latest of our FREE magazines – this time we’re covering the hot topic ‘Semiconductors’. Our products are playing a critical role in this growth industry in
Ellipsometers
Ellipsometry News Update A/W 2023
Spectroscopic Ellipsometry updates and news from our partners at J. A. Woollam. Including app notes, videos and workshop reviews.
J.A. Woollam Workshop and Course Review 2023
We recently held our 23rd annual J. A. Woollam Spectroscopic Ellipsometry Workshop and CompleteEASE software course. It was our biggest yet, with record attendance! See the reviews, photos and test
Case Study: IRSE to Determine Optical Properties of Metal Oxide Thin Films
Case study featuring a J A Woollam Infrared Variable Angle Spectroscopic Ellipsometer (Mark II) provided by Quantum Design UK and Ireland to Nottingham Trent University and the Medical Technologies
J A Woollam Workshop and Course Review 2022
A round up of images and testimonials in tis review of our latest Ellipsometry events – the annual Woollam Workshop and CompleteEase Course 2022
SOLD: Fully Refurbished J A Woollam M2000 V
We are offering an ex demonstration model of the J A Woollam AlphaSE Spectroscopic Ellipsometer with a discount of 15% and a two year warranty included in the deal.
Theta-SE Ellipsometer for Semiconductors
The theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact package at an affordable price. Here
Video: Prof. Joe Keddie Talks About his 20 Year Relationship with QDUKI
We were thrilled recently, when our longstanding friend and customer, Professor Joseph Keddie (Physics Department, University of Surrey), agreed to take part in our company video See what he had to
J.A. Woollam Workshop and CompleteEase Course Review
Read about our recent Woollam Workshop and CompleteEase software course – the 21st annual event of its kind. We have feedback from attendees and more information.
Free High-Tech Instrumentation Magazine
We bring you our first company magazine, including our product ranges, interviews, case studies, applications, new product launches and more.
Watch: QD-UKI Company Video
Launching our company video – featuring staff, customers, suppliers and products. Get a feel for us as a company. Watch interviews with suppliers, staff and customers.
Meet the speakers at the J A Woollam Spectroscopic Ellipsometry Workshop
The J A Woollam Spectrosopic Ellipsometry workshop took place on Monday 13 September at the MTIF Facility at Nottingham Trent University. We were very excited to announce the line up of speakers: U
Bespoke One-Off Ellipsometer Measurements
Seeking to better understand the optical and electronic properties of materials or thin films for nanophotonic or electronic applications? We recently announced our partnership with Medical Technol
Case Study: iSMART Research Group and Woollam IR-Vase II
Quantum Design UK and Ireland (QDUKI), in collaboration with the Medical Technologies Innovation Facility (MTIF) and Nottingham Trent University are proud to present this case study from the iSMART
When Ellipsometry Works Best: A Case Study With Transparent Conductive Oxides
Case study using the J. A. Woollam Mark II IR Variable Angle Spectroscopic Ellipsometry (VASE)
New Collaboration Between QDUKI and MTIF
Agreement will aim to benefit the life science and semiconductor market sectors and research labs to accelerate the development of new innovative technologies.
Ellipsometry Data Analysis
A tutorial from J A Woollam on Ellipsometry Data analysis.
Book your alpha-SE ellipsometer online demo now!
A simple, low cost system for measuring index and thickness with a spectral range of 380-900 nm For routine measurements of thin film thickness and refractive index, the alpha-SE ellipsometer allow
Mueller Matrix Ellipsometry – A Universal Optical Characterisation Technique
Mueller matrix ellipsometry is one of the hottest topics in the ellipsometry field. Just like “standard ellipsometry”, this non-destructive, optical characterisation technique measures the chan
Ellipsometric Porosimetry Webinar
Watch the recording now! Ellipsometric porosimetry is a non-destructive method to determine characteristics of porous thin-film samples. J A Woollam invites you to this webinar on Tuesday 23 June 2
