COMPOSITIONAL ANALYSIS AND MAPPING WITH MICRO X-RAY FLUORESCENCE
Sigray, Inc. develops advanced and completely new approaches to x-ray technology that formerly could only be found in synchrotron beamline experimental setups. The µ-XRF system from Sigray, AttoMap™ combines the resolution and the sensitivity from synchrotron XRF results and combines them into a laboratory-based instrument. Beside the AttoMap™ x-ray fluorescence system, Sigray is also offering proprietary x-ray optics and a new and breakthrough x-ray source named FAAST™.
The AttoMap™ x-ray analytical microscope offers the highest resolution and the highest sensitivity one can find in a laboratory based microXRF system. The AttoMap™ system can be used for transmission-based x-ray structural analysis as well as for fluorescence chemical mapping. The system has a chemical sensitivity of <1-10 ppm for trace element analysis and the measuring time is within 1 second.
The patented FAAST™ microfocus x-ray source (Fine Anode Array Source Technology) is based on a complete new x-ray source design. The x-ray target is made out of fine metal microstructures that are encapsulated in a diamond substrate. This complete new design was enabled due to recent developments in semiconductor processing techniques.
The powerful sensitivity and high resolution of the AttoMap produces synchrotron-quality elemental distribution mapping of trace elements for a wide range of research applications, spanning from the life and materials sciences to industrial use for pharmaceuticals, natural resources (oil and gas, mining) and semiconductor failure analysis. Visit Sigray's gallery
- The key advantages of the AttoMap™ system compared to standard µXRF systems are three major innovations developed by Sigray.
- The patented FAAST™ x-ray source with 50X higher brightness than microfocus sources used in standard microXRFs
- Proprietary, high efficiency x-ray mirror lens that provides a combination of small achromatic focus and large working distance for superior detection sensitivity and accuracy
- Unique detector geometry enabled by the design of the x-ray mirror lens that collects 10X more fluorescence x-rays than conventional designs.
- These innovations provide the AttoMap™ with the ultimate laboratory microXRF performance:
- Substantially higher resolution at single digit microns-scale (e.g. 3-5 µm MTF) resolution versus conventional microXRF allowing detection of nanoparticles down to 50-100 nm
- Dramatically faster analytical speed of a single minute - rather than a half day - for equivalent measurements on an AttoMap™ versus a conventional microXRF with up to 500X higher throughput
- Sub-ppm and sub-femtogram sensitivity in seconds, >100X the sensitivity of standard microXRF
- Only microXRF that can map trace elements (conventional microXRF is capable of mapping only major constituents at reasonable throughputs, as it requires long spot acquisition times for trace elements)
- Most accurate quantification capabilities and optional dual energy source for maximum flexibility
- Ability to analyze buried microfeatures
Attomap systems are customisable for the maximum flexibility to meet the needs of a busy central laboratory and for complete characterisation of complex geological materials. For challenging materials, Sigray provides the highest performance chemical and structural analysis solutions.
Sigray's high sensitivity, high resolution solutions can provide insight and correlative capabilities to fully understand biological pathways. Applications include cellular-scale metallomics research on the distribution of trace nutrients and nanoparticles in pathological tissue and plants.
Sigray's solutions provide the resolution and sensitivity required to measure microns-scale, nanometer scale variations in thin film thicknesses and more.
Sigray's x-ray optics feature numerous advantages for beamline system development, including large numerical aperture, focal spots down to 250 nm, achromatic focusing, leading performance for low energy x-rays, and more. Each optic is custom-designed for optimal performance at its specific beamline.