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Electron Microscopy

WEBINAR: Characterisation of conductive and magnetic nanostructures by Correlative In-Situ AFM & SEM

WATCH NOW The combination of different analytical methods into one instrument is of great importance for the simultaneous acquisition of complementary information. Especially highly localised probi

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Posted on Monday, May 4th, 2020
Electron Microscopy, Webinars

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New Paper: An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterisation

A new paper recently published reports the integration of the GETec atomic force microscope (AFSEM) into a helium ion microscope (HIM). Combining the two techniques opens the way for unprecedented,

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Posted on Monday, April 6th, 2020
Electron Microscopy, News

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