J.A. Woollam Workshop and Course Review 2025
We recently held our 25th Annual J. A. Woollam Spectroscopic Ellipsometry Workshop and CompleteEASE software course. See the reviews, photos and testimonials from attendees.
News
Technical Note: A New Approach to Low-Level Measurements of Nanostructures
How to Overcome the Challenges of Characterising Ultra-small Structures The study of new semiconducting materials, high temperature superconductors, photovoltaic devices, and organic electronic mat
PPMS® Features in Video from the University of Vienna
Two exciting news items featuring Quantum Design PPMS and DynaCool. New Video from University of Vienna and a NEW App Note.
Bell Labs Fellow Reviews the M81-SSM
This episode of well-known YouTube channel The Signal Path features host Shahriar examining the newly released Lake Shore M81 Synchronous Source Measure System (SSM)
Lake Shore’s Aerospace Heritage
With decades of experience delivering rugged, mission-ready equipment, Lake Shore—through its Environment by Janis division—offers cryostats engineered to meet the extremes of space and high-al
Ellipsometry Success at Boston Scientific, Clonmel
Learn how Boston Scientific in Ireland developed a recipe for ALD film deposition on implantable devices.
Second Edition of Quantum Science and Technology Magazine
In this second edition of Quantum Magazine, we continue our journey into the cutting-edge world of quantum technology. Building on the success of our inaugural issue, we bring you even more in-dept
Pushing Boundaries: High-Tech Instrumentation for the Aerospace Industry
Free magazine dedicated to high-tech instrumentation for aerospace applications from Quantum Design UK and Ireland
Understanding Multi-layer Thin Film Analysis
Accurate characterisation of multi-layer thin films is a critical aspect of materials science and engineering. This article outlines the ATLAS MicroXRF Spectrometer’s capabilities, calibratio
Vision Builds Up a Simpler Image
The importance of machine to wider automation is appreciable not only in the kind of integration that happens with so many robot cells and production lines – but also in the type of integrati
Transforming Detection and Analysis
Here, IXRF explains the wide applicability of microXRF systems, from QA in manufacturing to determining the material composition of artefacts on archaeological sites.
Surface-Sensitive Characterisation of ALD Films on Drug Particles
Traditional surface analysis techniques can’t reveal the true story at the nanoscale—especially for ultrathin ALD coatings. They miss crucial details about film uniformity and coverage…
How Tyndall National Institute is using Spectroscopic Ellipsometry
Discover how the Tyndall National Institute in Cork uses spectroscopic ellipsometry in their research.
Development of a Transparent Touch Sensor on Reconstituted Veneers
New Publication featuring QD Microscopy’s AFSEM – “Development of Transparent Touch Sensor on Reconstituted Veneers”
Coming Soon… Next-generation Temperature Controller
The upcoming Model 346 cryogenic temperature controller – 400 W of control power with measurements down to 300 mK
Upgrade your cryostat with a 1.2 Kelvin capability
This is now possible with the OneK-Optic option for existing CryoAdvance 100 and Gen3 Cryostation s100 systems in the field.
Did you know… The Lake Shore M81-SSM Integrates with our PPMS?
Yes, the Lake Shore M81 Synchronous Source Measure (SSM) system can integrate with the Quantum Design PPMS (Physical Property Measurement System).
FusionScope® Publication: Self-Restoration of a Wrinkled HZO Membrane
A Quantum Design China customer utilised the FusionScope in a recently published research article for in situ real-space observation of the self-restoration behaviour of wrinkles in ferroelectric m
Quantum Design Signs Agreement to Acquire NanoScience Division of Oxford Instruments
Quantum Design, headquartered in San Diego, CA, is pleased to announce it has signed a definitive
agreement to acquire the NanoScience Division of Oxford Instruments, located in Oxfordshire,
Ellipsometry for Stealth Coating
The IR-VASE II ellipsometer enables precise, non-destructive measurement of stealth coatings by characterising optical properties across the IR spectrum—crucial for reducing infrared detectabilit
