The J A Woollam Spectrosopic Ellipsometry workshop took place on Monday 13 September at the MTIF Facility at Nottingham Trent University. We were very excited to announce the line up of speakers:
User Talks
Chris Mellor
Associate Professor and Reader, School of Physics and Astronomy
University of Nottingham
Dr Chris Mellor obtained his Ph.D. at the University of Birmingham where he studied the properties of a 2D layer of helium ions trapped under the surface of superfluid helium. Following a move to the University of Nottingham he studied electron-phonon interactions and edge states in the quantum Hall regime and low temperature dissipation in nanomechanical devices. Today he leads the micro/nanofabrication activities at the University of Nottingham and his research interests include van der Waals materials, photonics and atom chips used in quantum technology applications. Recently he has used spectroscopic ellipsometry to study the van der Waals materials indium selenide and high temperature MBE grown hexagonal boron nitride, as well as to characterise PECVD dielectric layers.
Nikolaos Kalfagiannis
Senior Lecturer, School of Science and Technology, Nottingham Trent University
Dr Nikolaos Kalfagiannis is interested in light-matter interactions and optical properties of materials and thin films both from experimental (spectroscopic ellipsometry) and computational point of view (finite-difference time-domain method).
He is an expert in Spectroscopic Ellipsometry, a sophisticated optical technique that provides the complex refractive index of materials and thin films (in the latter case it also provides information about the thickness with Angstrom resolution). NTU is equipped with a unique IR Spectroscopic Ellipsometer (240–8000 cm-1 / 0.03 – 0.99 eV).
The Application Engineers at J A Woollam
Jeremy Vanderslice
Jeremy received his Master’s degree in Mechanical Engineering from the University of Nebraska. He is working towards his Ph.D. in Engineering where he is studying pulsed-laser deposited films using spectroscopic ellipsometry and is currently building a chamber for in-situ ellipsometric characterisation of PLD-grown films.
Andrew Martin
Andrew Martin joined J.A. Woollam as an Applications Engineer after completing his master’s degree in Electrical engineering in 2009. As an applications engineer, Martin provides support to customers through multiple communication media, including email, phone, and on-site short courses.
This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the workshop includes an introduction, fundamentals of ellipsometric data analysis, and an overview of ellipsometric applications in both research and production. New emerging applications are highlighted.
Application engineers from J A Woollam gave talks on the following topics:
- Theory and Fundamentals of Spectroscopic Ellipsometry
- Applications and Data Analysis Examples of Spectroscopic Ellipsometry
- Overview of J A Woollam Ellipsometers including the alpha-SE Ellipsometer
