J A Woollam alpha SE Spectroscopic Ellipsometer

Ellipsometer for spectral range of 380-900 nm

For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds.

Flexible – Works with your materials – dielectrics, semiconductors, organics, and more.

FEATURES

Focussing

  • Perfect for non-uniform or small samples.
  • Reduce beam diameter to ~0.3mm
  • Quick and easy magnetic attachment – optics snap into position
  • No alignment or calibration required

Camera

  • View the focused beam measurement location.
  • 10mm by 7mm field of view
  • Integrated image within CompleteEASE software

Translation

  • Fine-adjustment of the measurement location.
  • Manually adjust 12mm XY range with .025mm resolution
  • Integrated vacuum stage holds sample in place
  • Position the focused beam spot anywhere on the sample

Dr Shayz Ikram

Technical Director
tel:+44 (0)1372 378822
shayz@qd-uki.co.uk

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Supplier Info

For even more information, why not visit our suppliers website.

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