New AFSEM Publication: Nanostructuring of Copper Surface Read more Posted on Wednesday, May 27th, 2020 Electron Microscopy, News Electron Microscopy News #GETec
New Paper: An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterisation Read more Posted on Monday, April 6th, 2020 Electron Microscopy, News Electron Microscopy News #AFSEM #Electron Microscopy #GETec