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AFSEM

WEBINAR: Characterisation of conductive and magnetic nanostructures by Correlative In-Situ AFM & SEM

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Posted on Monday, May 4th, 2020
Electron Microscopy, Webinars

 Electron Microscopy Webinars # # # #

New Paper: An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterisation

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Posted on Monday, April 6th, 2020
Electron Microscopy, News

 Electron Microscopy News # # #

In-situ magnetic force microscopy analysis of magnetic multilayers and duplex steel with AFSEM®

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Posted on Friday, January 31st, 2020
Electron Microscopy, News

 Electron Microscopy News # #

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