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WATCH NOW The combination of different analytical methods into one instrument is of great importance for the simultaneous acquisition of complementary information. Especially highly localised probi
A new paper recently published reports the integration of the GETec atomic force microscope (AFSEM) into a helium ion microscope (HIM). Combining the two techniques opens the way for unprecedented,
Analyse magnetic properties of your sample with nanometer resolution using AFSEM® Magnetic compounds and multilayer structures are very promising for potential applications in spintronics, thermo-
