We are excited to announce that the J.A. Woollam Annual Newsletter, Issue #24 is live! This edition is packed with the latest advancements in spectroscopic ellipsometry, company milestones, and research insights.
Read the latest J. A. Woollam newsletter
Features include:
- Optical Critical Dimension Metrology with Spectroscopic Ellipsometry
- The Power of Gen-Osc: New Dimensions
- Cutting Edge Applications using Spectroscopic Ellipsometry
- Artifact Minimization and Interference Enhancement
About J. A Woollam
Single wavelength ellipsometry or spectroscopic ellipsometry, is a method to determine layer thickness and optical constants of thin films or substrates. An ellipsometer, either single wavelength or a spectroscopic, measures the polarisation change at reflection (or transmission in case of anisotropic sample). J. A. Woollam is the worldwide leader and the company has been perfecting spectroscopic ellipsometry for almost 40 years.
