Quantum Design UK and Ireland can offer you an ex-demo J. A. Woollam M-2000 FI ellipsometer at a discounted price. We expect quite a bit of interest in this platform, so please do register your interest in it soon and have a chat with us about your research application.
Bonus Benefits
This ex-demo M-2000 ellipsometer comes with 3 months warranty and a PC.
Try Before You Buy
Our Technical Director, Dr. Shayz Ikram would be happy to discuss your application and requirements, to see if the M-2000 is the right fit for you. He can also run sample measurements for you prior to purchase.
Price on application
Register your interest in the ex-demo J. A. Woollam M-2000 today.
Get in touch with Dr. Shayz Ikram by email below or call (01372) 378822.
About the M-2000 FI
The M-2000® line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterisation. An advanced optical design, wide spectral range, and fast data acquisition combine in an extremely powerful and versatile tool. The M-2000 delivers both speed and accuracy.
Woollam’s patented RCE technology combines Rotating Compensator Ellipsometry with high-speed CCD detection to collect the entire spectrum (hundreds of wavelengths) in a fraction of a second with a wide array of configurations.
“My group at Teledyne use the J A Woollam M2000 Spectroscopic Ellipsometer for some development activities, to determine the optical properties of new AR coating materials, or new AR Coating designs with existing or new materials.
We use the M2000 to monitor all our AR Coatings and some thin absorbing coatings, (d, n and k). It is also used to monitor photolithography, endpoint etch removal checks, (when selectively etching upper layers from underlying structure). More recently we are performing scans to monitor Ion implant uniformity across Ø150mm and Ø200mm silicon wafers. We use scans from time-to-time to monitor coating uniformity. We do physical vapour depositions, both with and without Ion Assisted Deposition. In-situ monitoring is via quartz oscillators. We have Al2O3 ALD capability. There is no need for in-situ monitoring, as ALD is very repeatable. We measure a witness sample from every deposition run and at least one production wafer.
In my opinion the JA Woollam M2000 spectrographic ellipsometer is the best and most reliable analytical kit I have ever used.”
Andrew Kelt, Senior Engineer, Teledyne UK Ltd.
The M-2000 is the first ellipsometer to truly excel at everything from insitu monitoring and process control to large-area uniformity mapping and general purpose thin film characterisation. No other ellipsometer technology acquires a full spectrum faster.
245-1690nm, 470 wavelengths
Ideal for many thin films: dielectrics, organics, semiconductors, metals, and more. Measure optical constants and thickness for coatings from subnanometer to tens of microns.
Applications
