from NanoMEGAS
The Challenge:
Identify precise orientation texture between ZnO substrate – sexipephenyl (6P) – ZnO deposited layer at nm scale
The Solution:
ASTAR technique couple with precession electron diffraction
Nanocrystalline ZnO is provided in an inorganic/organic system of ZnO deposited on sexiphenyl (6P). Initially, 6P was deposited on a-plane ZnO substrate at room temperature forming mesoscopic 1-dimensional islands of 6P. In a second step, the islands were capped with ZnO via molecular beam epitaxy at 373 K.
Information on the nanostructure of ZnO grown atop 6P was provided by high-resolution TEM. Imaging was performed along the [00.1] direction of the ZnO exhibits a perfect crystal structure when directly grown on the substrate. This was confirmed by Fourier transformation (FT) which also confirmed that ZnO grown atop 6P undergoes an imperfect growth.
Identification of the orientation of the nanocrystals and indexing of the lattice planes only based on FT is rather ambiguous and must be handled with care.
READ MORE IN THE ARTICLE BELOW.
ADVANCED IMAGING AND DIFFRACTION TOOLS FOR TRANSMISSION ELECTRON MICROSCOPY
Faster chip performances in ever shrinking electronic devices push circuits down to nanometer size. Spintronic devices and optical properties of organic semiconductors depend on their nm level local structure . Orientation and phase mapping with ASTAR sheds light to local texture and phases, while 3D electron diffraction tomography reveals detailed crystal structure of possible impurities. As metrology tool detailed strain maps down to nm scale allow to monitor precisely electrical properties and avoid device failure.
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