Sigray Attomap 200 µ-XRF system

Compositional Analysis and Mapping with Micro X-Ray Fluorescence 

Sigray, Inc. develops advanced and completely new approaches to x-ray technology that formerly could only be found in synchrotron beamline experimental setups. The µ-XRF system from Sigray, AttoMap™ combines the resolution and the sensitivity from synchrotron XRF results and combines them into a laboratory-based instrument. Beside the AttoMap™  x-ray fluorescence system, Sigray is also offering proprietary x-ray optics and a new and breakthrough x-ray source named FAAST™.

The powerful sensitivity and high resolution of the AttoMap produces synchrotron-quality elemental distribution mapping of trace elements for a wide range of research applications, spanning from the life and materials sciences to industrial use for pharmaceuticals, natural resources (oil and gas, mining) and semiconductor failure analysis. Click here for an amazing gallery of MicroXRF results

The AttoMap™ x-ray analytical microscope offers the highest resolution and the highest sensitivity one can find in a laboratory based microXRF system. The AttoMap™ system can be used for transmission-based x-ray structural analysis as well as for fluorescence chemical mapping. The system has a chemical sensitivity of <1-10 ppm for trace element analysis and the measuring time is within 1 second.

The patented FAAST™ microfocus x-ray source (Fine Anode Array Source Technology) is based on a complete new x-ray source design.  The x-ray target is made out of fine metal microstructures that are encapsulated in a diamond substrate. This complete new design was enabled due to recent developments in semiconductor processing techniques.

Sigray AttoMap System Schematics

FEATURES

  • FAAST™ microfocus X-ray source with 50x higher brightness than sources used in existing non-synchrotron microXRFs due to innovative X-ray target material design
  • More powerful source, high efficiency optics and unique paraboloidal geometry results in >100x sensitivity than existing non-synchrotron microXRFs
  • X-ray mirror lens unique design collects 10x more fluorescence X-rays versus conventional designs
  • 500x higher throughput versus existing synchrotron and non-synchrotron microXRFs
  • Trace element detection in seconds
  • 50-100nm nanoparticle resolution
  • Optional dual energy source for maximum flexibility

David Want

Product Specialist
+44 (0)1372 378822
david@qd-uki.co.uk

Satyam Ladva

Technical Sales Engineer
+44 (0)1372 378822
satyam@qd-uki.co.uk

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