FusionScope® and Kleindiek Micromanipulators
Combining Atomic Force Microscopy (AFM), Scanning Electron Microscopy
(SEM), and micromanipulators offers a synergistic approach to material characterisation and
nanoscale analysis.
Analyse a Complex Circuit Failure in Interlayer Circuit Structures
By combining the complementary strengths of SEM and AFM, FusionScope opens the door to a whole world of new application possibilities. Including failure analysis and quality control procedures.
FusionScope and Kleindiek Webinar
Join QD Microscopy and Kleindiek as they discuss integrating the correlative Microscopy platform with micromanipulators.
FusionScope® Publication: Self-Restoration of a Wrinkled HZO Membrane
A Quantum Design China customer utilised the FusionScope in a recently published research article for in situ real-space observation of the self-restoration behaviour of wrinkles in ferroelectric m
Exploring Nanoscale Magnetic Domains with FusionScope®
New App note on nanoscale magnetic domains, titled “Magnetic Imaging with FusionScope®”
NDT Elemental Analysis with a microXRF Spectrometer
SEM-XRF : Integrated e⁻Beam / X-ray XRF Elemental Analysis – X-ray Sources for Electron Microscopy (SEM). microXRF is completely non-destructive and does not require the sample to be coated
Analyse Electronic Components or Semiconductor Devices Using AFM
By combining the complementary strengths of AFM and SEM, FusionScope opens the door to a world of new semiconductor application possibilities.
FusionScope™ Workshop Review
A round up of pictures, testimonials and content from our two days of exclusive FusionScope workshops. Attendees got to see the system and have a hands-on experience.
