FusionScope’s unique self-sensing cantilever technology revolutionises the way surface measurements are performed by combining high-quality detection with exceptional operational simplicity. Each cantilever integrates a full piezo-resistive Wheatstone bridge, delivering all measurement signals electrically—eliminating the need for optical alignment. This design drastically reduces setup time and downtime, allowing users to perform repeat measurements quickly and reliably with minimal effort.
The self-sensing design not only improves usability but also maximises access for the electron beam to both the cantilever and sample region, ensuring seamless integration of atomic force microscopy (AFM) and scanning electron microscopy (SEM). Researchers benefit from clear, low-noise imaging and consistent data quality across sessions.
Conductive AFM tip
FEBID MFM tip
Available in a broad range of resonance frequencies, spring constants, and tip functionalities, FusionScope cantilevers provide the ideal solution for every application. Each cantilever includes a QR code that instantly links to its specifications, streamlining experiment preparation.
For advanced scanning probe microscopy (SPM) modes, FusionScope offers specialised FEBID-fabricated tips with radii below 10 nm—delivering outstanding resolution for electrical, magnetic, and thermal measurements. The combination of self-sensing detection and precision-engineered tips ensures repeatable, high-performance results with unparalleled efficiency and ease of use.
Cantilevers information and comparison download…
