J A Woollam CompleteEase Software Training Course 2021 🗓

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Scheduled Archive Ellipsometers Events


We will introduce the fundamentals of data analysis at a beginner-to-intermediate level. All details will be described using the latest CompleteEASE software. Each registered participant will be invited to participate in sessions, and to view recordings of each session afterwards. In addition to internet-sessions, students will receive relevant example data sets to practice.

As part of the partnership between Quantum Design and MTIF, which offers customers access the J A Woollam IR VASE II Spectroscopic Ellipsometer, this year’s Conference and Workshop on Spectroscopic Ellipsometry will be held at MTIF’s Research Centre located on Nottingham Trent University’s Clifton Campus. MTIF is a ISO 13485 certified medical technologies development organisation offering research and development services including thin film technology, printed electronics, nano-photonics, opto-electronic properties of materials and devices and laser processing.

Fully Booked

  • Dates:  September 14 – 16, 2021
  • Venue: Rooms CTLP09,10 & 11, Nottingham Trent University, Clifton Campus
  • Course Schedule: Please scroll down for more information
  • Course Price:  £700 excluding VAT
  • Early Bird / Student Course Price: £500
  • 40% discount on rate if multiple users from the same University would like to attend
  • We have booked a number of rooms at the Jurys Inn, Nottingham for £65/night single occupany including breakfast. Please contact Angela Carslake for the code to quote when booking.

We strongly recommend that you first attend our FREE Spectroscopic Ellipsometry Workshop on September 13 CLICK HERE

What’s Included?

Quantum Design UK and Ireland and J A Woollam Inc would like to involve as many users as possible to show the latest CompleteEase Version 6.61 software capability and advances that have been made. Lunch and refreshments will be provided. 

Course Content:

*2 Breaks one around 10:30 and 2:30

Day 1 Morning Session (9:00 – 12:00): “Introduction to Ellipsometry”           

  • Basic Theory
  • Anatomy of an SE Spectra
  • Flow of SE Data Analysis
  • Modelling Semiconductor Substrates

Day 1 Afternoon Session (1:00 – 5:00): “Transparent Films” 

  • Transparent thin films
  • Common Complexities in Thin films

Day 2 Morning Session (9:00 – 12:00): “Absorbing and Semi-absorbing Samples (B-Spline)”

  • Review transparent films
  • Semi-absorbing films and Absorbing film Examples
  • B-Spline
  • Opaque Layers
  • Semi-Absorbing Films

Day 2 Afternoon Session (1:00 – 5:00): “Semi-Absorbing Films (Gen-Osc)”

  • Oscillator Model Theory
  • Semi-Absorbing Films with Gen-Osc

Day 3 Morning Session (9:00 – 12:00): “Thin Metal Layers and Multi-Sample Analysis”         

  • Thin Metal Layers
  • Fitting SE + Transmission (Outline only)
  • Interference Enhancement
  • Multiple-Sample Analysis
  • Fit Log and Batch Analysis

Day 3 Afternoon Session (1:00 -5:00): “Mapping and Dynamic Data”

  • Mapping Data
  • Dynamic Data (“In-situ”)

One of our speakers, Dr. Nikolaos Kalfagiannis has recently published a Case Study, detailing the work of his iSMART research group, utilising the JA Woollam IR VASE II ellipsometer, provided by QDUKI…

Case Study iSMART Research Group

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