The Quantum Design FusionScope is on the cover of Microscopy Today for the November issue. The issue also features an article “A Highly Integrated AFM-SEM Correlative Analysis Platform“
In the journal which was published mid November the team from Quantum Design Microscopy (QDM) further explains the unique capabilities of correlative AFM and SEM, and how the FusionScope has revolutionised the way these two techniques can be combined.
Abstract
We describe the first truly correlative atomic force microscopy-scanning electron microscopy (AFM-SEM) platform designed from first principles and from the ground up for the study of sample properties under a wide range of magnifications. Combining these two microscopy techniques, “in situ,” into a highly integrated workstation opens unprecedented measurement capabilities at the nanoscale, while simplifying experiment workflows to yield a higher level of data throughput. Unlike SEM, the AFM offers true three-dimensional topography images, something SEM can only provide indirectly. This allows for the characterization of nano-mechanical properties, as well as for magnetic and electrical characterization of samples, which are increasingly of interest in material science, multi-component technologies (that is, solar cell and battery research), and pharmaceutical investigations. On the other hand, the SEM’s wide field-of-view is critical in identifying regions of interest with feature sizes of less than a micron, which are notoriously difficult to find over large spatial scales in conventional AFM systems. In addition, the SEM’s ability to visualize the AFM tip facilitates its navigation to aid the characterization of samples with challenging three-dimensional topographies. In this paper, we describe the major elements of the system design and demonstrate how correlative microscopy can help the characterization of samples with challenging morphologies such as the edge of a razor blade or the nanomechanical analysis of platinum nanopillars.
QDM’s Lukas Stühn, Sebastian Seibert, Hajo Frerichs, Marion Wolff, Christian Schwalb wrote this article in close cooperation with our colleagues Afshin Alipour, Kerim Arat, PhD, Hamed Alemansour, Luis Montes, Jeff Gardiner, Jost Diederichs, Brent Colvin, Andreas Amann, Kurt Jensen, William Neils, Stefano Spagna from Quantum Design.
Easy to use Correlative AFM/SEM Microscopy Platform
FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques.
Combine the complementary strengths of AFM and SEM like never before! The FusionScope fully integrates a wide range of advanced AFM measurement techniques with the benefits of SEM imaging. Seamlessly image your sample, identify areas of interest, measure your sample, and combine your imaging data in real time.
To discuss the FusionScope and your application….
Please contact our Technical Product Manager, Dr. Satyam Ladva by email or call (01372) 378822.
