Why Combine AFM, SEM, and EDS?
In nanoscience, precision is everything. But what if you could see, measure, and analyse your sample—all in one system? FusionScope brings together AFM, SEM, and EDS in a single platform, eliminating the need for sample transfers and ensuring perfect correlation. Here’s why this is a game-changer:
✅ See the AFM tip in real-time – Precisely position it using the SEM’s profile view.
✅ Analyse exactly where you measure – EDS confirms material composition at the nanoscale.
✅ Streamlined workflow – No need for multiple instruments, reducing time and error.
For applications like correlative nanomechanics, electrical characterisation, and high-resolution topography, FusionScope sets a new standard.
Interview
Shaping the Future of Scientific Research with New Correlative Microscopy Platform
Chris SchwalbChief Operations OfficerQD Microscopy GmbH
In this interview, industry expert Chris Schwalb provides an overview of the FusionScope®. He explains how this new instrument is transforming correlative microscopy with its innovative AFM-SEM integration, enabling efficient, high-resolution characterisation of complex samples.
Nanoparticles
Nanoparticles (NPs) have revolutionised biological, medical, and pharmaceutical sciences with applications in bio-separation, biosensing, diagnostics, and drug delivery. However, the precise characterisation of NPs, crucial for their functionality, remains a challenge due to their size, shape, surface properties, and material composition.
Using carboxyl (COOH) group-functionalised magnetic particles as a model system, FusionScope showcases its superior imaging capabilities:
🔭 Wide field of view SEM for particle localisation
🔎 High-resolution AFM inspection of topography and phase data
🤝🏼 Correlated coordinate system for seamless AFM and SEM data integration
Worth noting is that AFM scans of nanosized particles such as these usually would be challenging because they can easily stick to the AFM tip, reducing the image resolution or leading to image artifacts. Using Profile View in FusionScope allows easy inspection of the AFM tip before, after, and even during the measurements.
FusionScope’s advanced imaging and measurement modes make it possible to accurately characterise NPs – a feat that would be extremely difficult without this technology.
Easy to use Correlative AFM/SEM Microscopy Platform
FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques.
What’s your scientific challenge?
Discuss with our Technical Sales Manager, Dr. Luke Nicholls by email below or call (01372) 378822.
