A Fundamental Tool for Semiconductor Material Characterisation
A lot of R&D today is focused on developing renewable, sustainable sources of energy. This includes the study of promising new organic and thermoelectric materials, as well as technologies that use less power. But there are hurdles to overcome. Solar cell materials, for example, often have low mobilities and to accurately characterise them, you need highly sensitive measurement instrumentation.
Lake Shore Cryotronics provides technology that enables you to accurately measure many of these materials, such as OPV, amorphous silicon, and cadmium telluride solar cell materials.
Lake Shore also offers systems that allow you to:
- Non-destructively measure transparent conductive oxide and dielectric material responses
- Explore vibrational resonances of OTFT and OLED materials
- Measure properties of novel photovoltaic materials
- Characterise photoelectrochemical behaviors of crystals or metal oxides
- Determine magneto-caloric properties for new refrigerator technologies
- Analyse materials for potential use in high-capacity hydrogen storage
- Characterise promising composites and polymers for new supercapacitor designs
This guide, written by Lake Shore Senior Scientist Dr. Jeffrey Lindemuth, reviews methods to measure the resistivity of materials, then discusses the theory of Hall measurements. Intrinsic and geometric sources of errors are explored, and the methods developed to minimise the effects of these errors are provided. As the materials of interest have evolved over time, so have the methods to minimise these errors.
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Want to know more?
Discuss your application with our Technical Sales Engineer, Dr. Alex Murphy by email below or call (01372) 378822.
