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Sigray PrismaXRM Tri-Contrast X-Ray Microscope
AWARD-WINNING SUB-MICRON 3D X-RAY MICROSCOPE
Novel Tri-Contrast Capabilities
Spatial resolution 0.5 µm
Designed for in-situ Experiments
Introducing PrismaXRM: the 3D X-ray microscope with the resolution and performance of the industry leaders… and more. The world’s most advanced tri-contrast imaging system, PrismaXRM represents the next generation of laboratory micro-CT.
- 3D x-ray microscope with industry-leading spatial resolution
- Achieve down to 0.5 µm spatial resolution and <100nm voxels
- Maximum versatility with novel contrast mechanisms
- Patented multi-spectral source (MSS) for quasi-monochromatic illumination to allow up to 10X throughput on the most difficult-to-image, low contrast samples
- Multiple detectors in a single system
- Optimise your field of view and resolution
Nanofocus X-ray source and optional second source
- Software: GigaRecon Tomography and Sigray3D Acquisition
PrismaXRM achieves the highest spatial resolution available on the market at 500nm (0.5 µm).
Shown below are individual eggs resolved in the eggs sacks of a daphnia (water flea) specimen.
PrismaXRM was engineered to address the needs of busy central research facilities, which encounter a wide variety of sample shapes, sizes, and composition. The research facilities are often tasked with imaging the samples at the best quality and at the fastest acquisition times. Because no single set of components can address the full range, PrismaXRM can incorporate multiple x-ray sources and detectors into a single system. One key option is a Multi-Spectral Source (MSS) that is also used in Sigray’s ChromaXRM system. This source provides multiple quasi-monochromatic beams of x-rays (unlike the polychromatic x-rays produced by most system’s sources) to provide the outstanding contrast needed for extremely challenging samples, such as low-Z structures in novel lithium battery concepts and biological samples.
Image: PrismaXRM-800 can incorporate the patented Multi-Spectral Source used in the Sigray ChromaXRM-500, which provides outstanding contrast for challenging samples because it produces quasi-monochromatic x-rays.
PrismaXRM offers both Quantitative Phase and propagation phase contrast capabilities. Unlike propagation phase contrast, which is an edge-enhancing technique, Quantitative Phase provides direct access to the refractive index of a material, allowing decoupling of the material’s atomic number (Z) from its density. This complements absorption contrast which is a convolution of Z and density. Quantitative Phase also provides excellent performance for biological materials and polymers – and is particularly sensitive to voids and cracks.
Image: Quantitative Phase allows phase retrieval, providing clear separation of electron density.
|Overall||Spatial Resolution||0.5 um with 40X objective|
Optional second transmission or reflection source
|Voltage||30 – 160 kVp|
|Target(s)||Up to 5 targets.
Includes selection from Cr, Cu, Rh, W, Mo, Au, Ti, Ag.
Others available upon request.
|Detector(s)||Type||Up to 5 detectors. Includes LFOV detectors and high resolution detectors.|
|Camera||4MP deep cooled CCD|
|Visible Light Camera||16MP alignment camera|
|Software||Command and Control||Sigray 3D with Intuitive interface|
|Reconstruction||GigaRecon – fastest commercial CBCT reconstruction software|
|Offset Scans||Expands the horizontal FOV. Sigray software advantage|
|Helical Scan||Enabled for tall samples|
|AutoPilot||AI-assisted microscope operation for unsupervised acquisition|
|Linux Workstation||Interface is on a Windows workstation, while a separate robust Linux workstation controls the system. Advantageous for reliable 24-7 operation.|
|EPICS||Open-source software controls for maximum flexibility|
|Dimensions||Footprint||88″ L x 49″ W x 92″ H|
|Maximum Sample Size||30cm width and 50cm height*
*Note max FOV is limited by each detector
Semiconductor Failure Analysis
3D x-ray microscopy has become the workhorse approach to investigating failures such as cracks and voids in semiconductor packaging. Sigray PrismaXRM offers the leading resolution, contrast, and resolution needed for quickly identifying the failure modes. In addition, the system’s novel tri-contrast enables rapid identification from a 2D radiography – without requiring a complete tomography.
Carbon Fibre Reinforced Composites
Carbon fibre reinforced polymers (CFRPs) are extremely challenging to image with conventional x-ray techniques, such as microCT, due to the low absorption of carbon fibres and the surrounding polymer matrix. Quantitative Phase™ and Subresolution Darkfield™ images acquired with the PrismaXRM provide measurements of defects and fibre orientation that cannot be observed using high-resolution absorption contrast, due to the low x-ray contrast between carbon fibres and polymers.
In-situ Microstructural Evolution
A significant advantage of PrismaXRM’s design is to retain high submicron resolutions for large samples, enabling high fidelity imaging of samples placed in larger in-situ cells. The 3D microstructural evolution can be imaged of samples under various conditions, including: heating, cooling, tension & compression, and more. We will provide robust in-situ solutions for your needs.
Intact Batteries and Batteries in-operando
PrismaXRM provides submicron high resolution even for large samples and samples placed within in situ cells. The flexibility of the PrismaXRM in switching between multiple fields of view allows hierarchical characterization of batteries – from the full FOV to detailed region-of-interest imaging – without requiring de-packaging the battery. This allows non-destructive identification of problems such as small defects (cracks, particles) and shorts.