Sigray Inc. is excited to unveil their latest innovation, EclipseXRM™. Director of X-ray Microscopy, Jeff Gelb, presents a groundbreaking 3D x-ray microscope (XRM) that provides the highest resolution performance on the market.
Highlights of the Webinar:
- Unprecedented Spatial Resolution: EclipseXRM™ delivers an extraordinary 0.3 μm (300 nm) spatial resolution, including high resolution at large woresolution and the highest 3D image clarity, making it a game-changer for various applications.
- Breakthrough Patent-pending High Efficiency Architecture using multiple x-ray sources and x-ray detectors.
- In Situ Imaging Capabilities: Achieve submicron resolution at large working distances, enabling high-quality imaging under diverse environmental conditions.
- Enhanced X-ray Microscope Capabilities: Learn about our AI-based software, advanced scan modes, superior phase contrast performance, and multi-spectral source for near-monochromatic imaging.
Applications and Impact:
Examples will be presented on how EclipseXRM™ has revolutionised fields in failure analysis, 3D printing, geology, battery cathode and anode device characterisation, and biological research. Its unparalleled flexibility and commercially-leading resolution performance make it the ultimate tool for researchers in busy Central Laboratories.
Discover the Sigray EclipseXRM 3D X-ray Microscope
Highest X-ray Resolution Performance
Patent-pending technology
Spatial resolution of 0.3 µm
Submicron resolution, even for large working distances
About the Speaker
Jeff Gelb
Director of X-ray Microscopy·Sigray, Inc.
Jeff is Director of X-Ray Microscopy at Sigray in Concord, California, USA, focused on next-generation 3D X-ray imaging. He studied physics at UC Santa Barbara and joined Xradia in 2006, working with multi-scale 3D tomography, which carried forward into his later work with correlative microscopy at ZEISS. Jeff completed a Master’s degree in Materials Engineering at San Jose State in 2017, with a research emphasis in developing non-destructive characterisation routines for commercial lithium-ion batteries. Jeff joined Sigray in 2017 and is excited about the future of 3D imaging, with much of his current work focused on automation, software, and data capture & processing workflows.
If you have questions ahead of the event, please contact our Technical Product Manager, Dr. Satyam Ladva, by email or call (01372) 378822.
