Understanding Multi-layer Thin Film Analysis
Accurate characterisation of multi-layer thin films is a critical aspect of materials science and engineering. This article outlines the ATLAS MicroXRF Spectrometer’s capabilities, calibratio
Thin Film
Thin film thickness inspection by hyperspectral imaging
Thickness is a crucial quality parameter in thin films and coatings. The thickness and homogeneity strongly affect the film’s functionality and they need accurate monitoring. X-ray techniques and
