Darkfield Imaging Video and Paper

Sigray: Darkfield Imaging for Advanced Packages and MEMS

Darkfield Imaging Video and Paper

Addressing Failure Analysis Challenges in Advanced Packages and MEMS using a novel Phase and Darkfield X-ray Imaging System

We are delighted to bring you the recording of S H Lau (Vice President of Business Development, Sigray) at ISTFA (International Symposium of Test and Failure Analysis, under Emerging Failure Analysis Techniques.

We also have the paper as a PDF download for you here:


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