An innovative architecture for coordinating low-level measurements from DC to 100 kHz
The MeasureReady™ M81-SSM (Synchronous Source and Measure) system provides a confident and straightforward approach for advanced measurement applications. The M81 eliminates the complexity of multiple function-specific instrumentation setups, combining the convenience of DC and AC sourcing with DC and AC measurement, including a lock‑in’s sensitivity and measurement performance.
The M81-SSM uses patent-pending MeasureSync™ signal synchronisation, enabling continuous data sampling on every channel. Noise and sensitivity are on par with the best scientific-grade source and measure instruments.
Features
- Unique real-time sampling architecture for synchronous sourcing and measuring
- Designed for scientific-grade low-level measurement applications
- The absolute precision of DC plus the detection sensitivity performance of AC instrumentation
- Unique, flexible instrument/distributed module architecture
Flexible measurement capabilities
The M81-SSM provides DC and AC stimulus and measurement capabilities for characterising materials and devices in cryogenic, room temperature, and high-temperature environments.
Choose a combination of differential current source and voltage measurement modules for low-resistance applications requiring a precise stimulus current and the noise-cancellation benefits of balanced (floating) sample connections. Or mix and match with additional voltage source and current measurement modules for complex higher-impedance or gate-biasing applications where precise voltage control and sweeping test regimes are required.
Unlike a narrow-bandwidth DC system, these modules operate from very low frequencies to 100 kHz. You can select a measurement bandwidth to avoid 1/f noise and other bands where test environment noise is highest.
The system’s MeasureSync™ technology samples all sourcing and measurement channels at precisely the same time, enabling multiple DUTs to be tested under identical conditions so you can obtain consistent data.
The included MeasureLINK™ software provides configurable measurement scripts and loops to support a variety of applications. It facilitates easy integration with Lake Shore as well as third-party systems.
These combined capabilities make the M81‑SSM a superior solution for characterising several test structures, including nanostructures, single- and multilayer atomic structures, MEMs, quantum structures, organic semiconductors, and superconducting materials.
