Explore the Next Generation of X-ray Microscopy

With Sigray’s EclipseXRM-900

X-ray microscopy has become a workhorse technique for failure analysis. 

However, the well-known limitation of the state-of-the-art is that the highest achievable spatial resolution is 0.5µm. Furthermore, the high resolution is only achieved at a small FOV.

EclipseXRM is a next-generation 3D x-ray microscope (XRM) developed to overcome both resolution and FOV limitations, offering 0.3µm spatial resolution and large detector formats up to 27MP.

Key Highlights of EclipseXRM include:

  • High Spatial Resolution: EclipseXRM delivers the highest resolution performance capabilities. With a true spatial resolution of 0.3 μm, EclipseXRM surpasses previous leading systems, which typically offer resolutions around 0.5 μm. Furthermore, the image quality is crisp and unblurred, comparable to SEM-quality imaging.
SD Card imaged at 0.3 um to observe wire bond interface layer
  • Ability to Zoom in at Progressively Higher Resolutions: EclipseXRM offers the flexibility to achieve increasingly higher resolution interior tomography scans without trimming or remounting the sample. This allows identification of regions of interest as shown in the example below (imaged at 7 μm, 3 μm, and 0.3 μm in an anti-acid tablet without cutting):
  • Large FOV at Resolution: Another powerful aspect of the EclipseXRM is its ability to upgrade from a standard 6.7MP detector to an “ultra-ultra large FOV” 27MP detector, enabling the largest FOV at resolution. 

If you have any questions would like to test how EclipseXRM can support your failure analysis needs through complimentary demos on your samples of interest, please don’t hesitate to contact our Technical Product Manager, Dr. Satyam Ladva by email or call (01372) 378822.

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