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DENSsolutions Wildfire In Situ TEM
In Situ TEM Heating
The Wildfire In Situ Heating Series enables researchers to perform thermal studies in a controlled and stable environment within your TEM. Catering for a variety of application spaces, the Wildfire In Situ Heating Series transforms your high-end TEM from a static imaging tool to a multi-functional laboratory. Applications include heat treatment and failure analysis.
The Wildfire system consists of 4 main components:
- Nano-Chip
- Sample holder
- Heating control unit
- Control software
Applications areas include low dimensional materials, metallurgy, and soft matter.
FEATURES
- Resolution 0.6Å
- Heating 1300°C
- Temperature stability 0.005°C
- Alpha tilt and beta tilt stages available depending on TEM configuration
- Integrates seamlessly with DENSsolutions Impulse Software
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OPTIONS
DENSsolutions now introduces the 3rd generation of the FIB stub which enables you to prepare a lamella and place it directly on your chip, all inside the FIB.
In this version, many improvements were made to make your sample preparation easier, safer and quicker.
Ease of Use
The sample is located on an additional flat side of the stub. This ensures a conventional geometry and the very same and the well-known process used by any FIB operator.
Improved Imaging
Reduced shadowing improves the imaging quality, especially at low accelerating voltages during final milling and polishing steps (1-5 kV). The charging is also minimised, further improving the quality of the images and samples.
Smart Clamping
Due to a dedicated pocket for the Nano-Chips with an integrated end-stop and a smart clamp mechanism, loading and unloading of the chip becomes a simple and a fast process. There is no need to use sticky tapes to fix the chip and the possibility to damage the fragile window membranes when handling the chips is greatly reduced.
Safe Procedure
The stub is engineered in such a way that the position of the sample and the Nano-Chip are on the same height. This minimises the possibility of crashing into the pole piece, the gas injection system or the manipulator.
High Level of Compatibility
The FIB stub is compatible with Thermo Fisher Scientific/FEI and JEOL focused ion beam microscopes. For compatibility with Zeiss, Tescan and Hitachi FIBs, please contact us. The FIB stub can be used with all double tilt (Wildfire/Lightning) Nano Chips.
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Applications
Piezoelectrics
Reram
Solar cells
