DENSsolutions Lightning In Situ TEM

In Situ TEM Biasing & Heating

The Lightning In Situ TEM Biasing & Heating Series provides you the power to obtain real-time information about your specimen under a controllable electrical and thermal environment. Investigate the next generation of nano-electronic materials and devices with the Lightning Series.

  • Simultaneous Heating and Biasing
  • Dedicated Heating – up to 1300 oC
  • Biasing – 200 kV/cm at RT (150 kV/cm at 900 oC)
  • Resolution – 60 pm

Application areas include Piezoelectrics, ReRam and Solar Cells.

The Lightning system consists of 4 main components:

  • Nano-Chip
  • Sample holder
  • Heating control unit
  • Control software

FEATURES

  • Simultaneous Heating and Biasing
  • Dedicated Heating – up to 1300 oC
  • Biasing – 200 kV/cm at RT (150 kV/cm at 900 oC)
  • Resolution – 60 pm
  • SiN membrane is 800um^2 area size whilst TH is 10um diameter
  • Integrates seamlessly with DENSsolutions Impulse Software

Contact our

Technical Sales Team
+44 (0)1372 378822
info@qd-uki.co.uk

TESTIMONIALS

“Quantum Design and DENSsolutions have provided us with continual advancements of in situ TEM holders by providing an exciting and ever-improving level of detail into a range of nano-scale dynamic processes. We have purchased the Lightning, Climate and Stream systems, these systems allow us to perform a wide range of experiments at the nano level in situ investigations, from heating of steels and quench them, observing the formation of nano crystals. Gas absorption by Metal Organic Frameworks, or in situ growth of nanoparticles and crystals in liquid. All these systems experiments require great stability and precision and ease of use, all of which are provided by these holders and chips. QD UKI have been extremely helpful and supportive keeping us updated with the latest chip designs and holder sundries, and supplying chips quickly”

Dr Andy Stewart, University of Limerick

“We are using the DENS Lightning D9+ holder to investigate the magnetostructural transition and magnetic phase boundary motion in FeRh thin films. The Lightning D9+ is perfect for this study because we need to heat the FeRh thin films into a state of co-existing antiferromagnetic (AF) and ferromagnetic (FM) domains, and then simultaneously apply current pulses to induce movement of the AF / FM phase boundaries.

The DENS Lightning system is very versatile, allowing us to heat samples to elevated temperatures with extreme stability, whilst using the Impulse software to run a range of biasing experiments including current, voltage and electric field sweeps. The whole system is very elegant and easy to use, but still allows the user to design complex experiments that involve simultaneous heating and biasing, as well as each stimulus in isolation.

QD UKI provides excellent support and guidance, from detailed pre-sale technical consultation, genuine enquiries on product performance and quick responses to sales quotes, as well as updates on future products.”

Dr Trevor Almeida, Physics and Astronomy, University of Glasgow

DENSsolutions now introduces the 3rd generation of the FIB stub which enables you to prepare a lamella and place it directly on your chip, all inside the FIB.

In this version, many improvements were made to make your sample preparation easier, safer and quicker.

 

Ease of Use

The sample is located on an additional flat side of the stub. This ensures a conventional geometry and the very same and the well-known process used by any FIB operator.

Improved Imaging

Reduced shadowing improves the imaging quality, especially at low accelerating voltages during final milling and polishing steps (1-5 kV). The charging is also minimised, further improving the quality of the images and samples.

Smart Clamping

Due to a dedicated pocket for the Nano-Chips with an integrated end-stop and a smart clamp mechanism, loading and unloading of the chip becomes a simple and a fast process. There is no need to use sticky tapes to fix the chip and the possibility to damage the fragile window membranes when handling the chips is greatly reduced.

Safe Procedure

The stub is engineered in such a way that the position of the sample and the Nano-Chip are on the same height. This minimises the possibility of crashing into the pole piece, the gas injection system or the manipulator.

High Level of Compatibility

The FIB stub is compatible with Thermo Fisher Scientific/FEI and JEOL focused ion beam microscopes. For compatibility with Zeiss, Tescan and Hitachi FIBs, please contact us. The FIB stub can be used with all double tilt (Wildfire/Lightning) Nano Chips.

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