Glasgow University – One A The Square
September 16, 2025
We are celebrating 25 years of Spectroscopic Ellipsometry workshops with our partners, J. A. Woollam.
This free of charge workshop is aimed at both experienced ellipsometry users as well as people new to ellipsometry. The format of the workshop includes an introduction, fundamentals of ellipsometric data analysis, and an overview of ellipsometric applications in both research and production. New emerging applications are highlighted.
Application engineers from J. A. Woollam will give talks on the following topics:
- Theory
- Applications
- Products
Agenda
See the Workshop Agenda here
Meet the Speakers
Dr Jianing Sun
Jianing received her Ph.D. in Materials Science and Engineering from the University of Michigan – Ann Arbor. She holds Master and Bachelor degrees in Chemical Engineering from Tsinghua University in China. Her Ph.D. research involved characterizing low-dielectric constant thin films using Positronium Annihilation Lifetime Spectroscopy (PALS). She worked as a process engineer on back-end processes and characterizations in the semiconductor industry and lecturer at University of Nebraska before joining J.A. Woollam Company in 2008 as an Applications Engineer.
Nina Hong (Ph.D.)
Nina Hong, Ph.D., received her doctorate in physics from the University of Nebraska-Lincoln. She also holds Bachelor’s and Master’s degrees in physics from Hanyang University (South Korea). Her doctoral research centered on room-temperature solid-state neutron detectors utilizing boron-rich carbon thin films, involving extensive material characterization. Since joining the J.A. Woollam Company in July 2012, Nina has specialized in anisotropic materials characterization using Mueller matrix spectroscopic ellipsometry, with recent research interests including flexible optical devices, anisotropic crystals, and metamaterials.
Registration
To register your interest in attending, please complete the form below or email Angela Carslake. We will acknowledge your registration usually within a few days.
J. A. Woollam IR VASE II Spectroscopic Ellipsometer
Ellipsometer for thin films and bulk materials characterisation
You might also be interested in attending our CompleteEase Software Training Course.
Testimonials
“We’re really proud to be in our third decade of the J. A. Woollam/QDUKI hosted ellipsometry events here in the UK. It’s a privilege to meet existing and new users each year. They really shape how the workshop and short course works, so it’s never the same. Over the last 20+ years we’ve been able to present new developments and capabilities as well as introduce new products to ellipsometer users.”
Jeremy Vanderslice, Applications Engineer, J. A. Woollam Company
“Excellent introduction to SE”
Chris Morgans, Swansea University
“This week I had this chance to attend Ellipsometry workshop in Manchester University held by J. A. Woollam ‘Industry leading Ellipsometer for thin film characterisation’. It was great experience to learn more about equipment, meet experts in this field and get to know new techniques for modelling thin film thickness. Special thanks to Dr. Shayz Ikram and Angela Carslake for organising this wonderful event.
Zahra Ghaferi, Boston Scientific
Any questions ahead of the event?
Get in touch with our Technical Director, Dr. Shayz Ikram by email or call (01372) 378822.
Quantum Design UK and Ireland (QDUKI) reserves the right to use any photograph/video taken at any QDUKI event without the expressed written permission of those included within the photograph/video. We will not, however, use identifying information such as names or company/institution without your permission.
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