QDUKI at Advanced Materials Show 2027
Join us at the Advanced Materials Show 2027 to see one of the most comprehensive materials characterisation portfolios in the world. We will be on hand to discuss your research challenges,
Electronic Failure Analysis
Why is Electrical Probing of Nanostructures so Difficult?
Electrical characterisation at the nanoscale plays a central role in advancing semiconductor devices, nanomaterials, and next-generation electronics. However, probing individual nanostructures rema
Root Cause Analysis for Semiconductor Wafer Contamination
PiFM identifies sub-20 nm organic and inorganic wafer contaminants non-destructively, accelerating semiconductor root-cause analysis.
WEBINAR: Quality Assurance at Highest Level
The use of infrared cameras offers great potential for quality assurance and monitoring in industry. This free of charge webinar will give you an insight into the key aspects of automating these pr
What Kinds of Electronic Failure Analysis Problems Can Benefit from Ellipsometry?
Woollam offers spectroscopic ellipsometers that cover broad wavelength ranges and support a variety of sample types — from dielectrics and semiconductors to metals, multilayers and complex stacks
Electronic Failure Analysis Magazine
Free magazine on high-tech instrumentation for electronic failure analysis. Case study, app notes, new products and more
CASE STUDY: Fault Isolation on Chips and Power Modules
STMicroelectronics is a European manufacturer of semiconductor devices and integrated circuits with locations worldwide. Their products are mainly used in the automotive industry and for the Intern
