- Models
- Specifications
- Downloads
- Applications
- Related Products
- Contact
- Back To Spectroscopy
- Back To Optics
- Back To Hyperspectral
- Back To Cameras
- Back To X-Ray
- Back To Light Measurement
- Back To Characterisation
- Back To Electron Microscopy
- Back To Magnetometry
- Back To Ellipsometers
- Back To Cryogenics
- Back To Lake Shore
IXRF SEM/EDS
Energy Dispersive X-ray Spectroscopy (EDS) for Scanning Electron Microscopes (SEM)
IXRF Systems’ SEM/EDS packages deliver premium detector technology as well as both industry-leading and unique (to IXRF) features. No-cost software upgrades are included for the life of the system, so the analyst is never out of date.
IXRF offers an all-inclusive high-end software suite featuring a myriad of spectra, mapping, imaging, and advanced automation analysis tools. IXRF couples only premium quality detectors with every system and offers industry leading features, in addition, to unique features no other EDS systems can offer. IXRF offers free software upgrades for the life of the system, so the analyst is never out of date.
Profile
Profile
Profile
Profile
Profile
Profile
Profile
SEM/EDS Electronics
Silicon Drift Detectors (SDD) are available with a choice of window materials, from Beryllium (8µm) to Thin Polymer (for light element x-ray transmission). Sensor active areas of 10mm² to 100mm² are offered. In addition, all or our SDD versions are vibration free.
IXRF’s range of electronically cooled (LN2 free) SDD are optimised when coupled with an innovative Ethernet-based digital pulse processor. Our SDD detectors provide exceptional and stable performance over a wide range of input count rates.
Our Model 550i SEM/EDS digital electronics are optimised for true “data streaming” and ultra-fast X-ray processing. System incorporates Active Imaging combined with Digital Signal Processor (DSP) and a 4096 multi-channel analyser (MCA).
IXRF can update your SEM/EDS software and computer to the safety and security of the Windows 10 OS environment. Interoperability with Microsoft Office means generation of reports is simple and intuitive. And your SEM will be compliant with the latest corporate/institutional security protocols.
microXRF X-ray sources for Scanning Electron Microscopes (SEM): addition of an polycapillary X-ray tube and Iridium Ultra software will transform your SEM’s quantitative analytical capabilities. Higher peak to background ratios enable greater elemental sensitivity for higher Z elements: sensitivity exceeding e–-beam excitation by a factor of 10-1000X.
SEM/EDS Overview
- Identifying Elements
- Spectrum Processing
- Annotations
- Spectrum Overlay
- Spectrum Reporting
SEM/EDS Imaging
- Image Acquisition
- Analysis Suite (Toolbar)
- Morphology
- Segmentation
- Stitching/Montage
- RoboStage
SEM/EDS Mapping
- Multielement Quantitative Mapping
- Overlay Maps
- Map Analysis Suite (Toolbar)
- Extract Spectra (Freehand, Spot, Area)
- Extract Linescan
- DataView (Intensity/Concentration)
- Beam Drift Correction
- Maximum Pixel Spectrum
- Map stitch & montage
- Automate Stage and Beam automation
- Composition Mapping
- Phase Analysis
SEM/EDX Linescans
- Multielement Linescan Acquisition
- Linescan Overlay
- DataView (Intensity/Concentration)
- MultiScan
SPECIFICATIONS
Downloads
Supplier Info
Forensics
Including gun shot residue, forensic science
Semiconductor
Solar Cells
Manufacturing
Pharmaceuticals
Geology
Art Inspection
Plus, Painting authenticity/dating; Paints, inks, pigments; Paint Cross Sections
Particle Accelerators
