New Collaboration Between QDUKI and MTIF
Agreement will aim to benefit the life science and semiconductor market sectors and research labs to accelerate the development of new innovative technologies.
Ellipsometry
Ellipsometry Data Analysis
A tutorial from J A Woollam on Ellipsometry Data analysis.
Book your alpha-SE ellipsometer online demo now!
A simple, low cost system for measuring index and thickness with a spectral range of 380-900 nm For routine measurements of thin film thickness and refractive index, the alpha-SE ellipsometer allow
Mueller Matrix Ellipsometry – A Universal Optical Characterisation Technique
Mueller matrix ellipsometry is one of the hottest topics in the ellipsometry field. Just like “standard ellipsometry”, this non-destructive, optical characterisation technique measures the chan
Ellipsometric Porosimetry Webinar
Watch the recording now! Ellipsometric porosimetry is a non-destructive method to determine characteristics of porous thin-film samples. J A Woollam invites you to this webinar on Tuesday 23 June 2
Feedback from the 19th Annual Woollam Workshop & CompleteEase Course
Attendees at the latest annual Woollam Workshop and CompleteEase Course gave the workshop an overall score of 88.6%. The demonstrations scored particularly highly. Hosting the workshop and course w
J A Woollam launch the NEW theta-SE Ellipsometer
J A Woollam’s NEW theta-SE is a push-button spectroscopic ellipsometer for characterising thin film uniformity. It features advanced ellipsometry instrumentation in a compact package at an affo
J A Woollam Software Update: CompleteEase 6
New features for the leading data analysis platform NEW! Push-Button Analysis Tools CompleteEASE has always included pre-built models that enable push-button analysis of transparent films. We’ve
