Case Studies, News & Q&A
We provide the tools for you to explore the powerful intersection of cutting-edge microscopy techniques driving innovation in materials science. Here, you’ll discover how the integration of Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), and Energy-Dispersive X-ray Spectroscopy (EDS) is opening new frontiers in high-resolution imaging and elemental analysis.
A featured publication highlights the role of QD Microscopy’s AFSEM Nano in advancing transparent touch sensor technology—demonstrating how correlative imaging delivers deeper insights into nanoscale performance.
Dive into the capabilities of Quantum Design Microscopy’s FusionScope®, which has proven essential in visualising magnetic domains and uncovering the self-restoring behaviour of HZO membranes, critical for next-gen memory devices. In our latest application note, we detail nanoscale bone collagen analysis, offering valuable information for biomedical and structural research.
Understanding the intricacies of multi-layer thin film analysis is another focus, providing tools and insights for researchers working in coatings, electronics, and material durability. Additionally, don’t miss our in-depth Q&A with IXRF Systems, where we explore how advanced detection and analysis technologies are transforming workflows across scientific and industrial domains.
Explore these resources to see how combined microscopy methods are pushing the boundaries of discovery at the nanoscale.
You may also like our FREE magazine – dedicated to high-tech instrumentation for semiconductor applications.
NanoMEGAS Precession Electron Diffraction
FusionScope™ from QD Microscopy
AFSEM®nano Atomic Force Microscope
Energy Dispersive X-ray Spectroscopy (EDS) for Scanning Electron Microscopes (SEM)
Exploring Nanoscale Magnetic Domains with FusionScope®
In the newly released application note, “Magnetic Imaging with FusionScope®” researchers are introduced to the capabilities of the FusionScope®, an integrated platform that combines Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), and Magnetic Force Microscopy (MFM) in a single high-vacuum system. This note provides an overview of how FusionScope facilitates precise, correlative imaging of magnetic micro- and nanostructures with enhanced sensitivity and spatial resolution.
FusionScope is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques. Combine the complementary strengths of AFM and SEM like never before! The FusionScope fully integrates a wide range of advanced AFM measurement techniques with the benefits of SEM imaging. Seamlessly image your sample, identify areas of interest, measure your sample, and combine your imaging data in real time.
FusionScope™ Correlative AFM with SEM Microscopy Platform
Advanced Tribology and Wear Research at The University of Sheffield Using NanoMEGAS
from Dr. Jiahui Qi
The Tribology and Wear Lab at the School of Chemical Materials and Biological Engineering, University of Sheffield, is recognised for its expertise in the high-resolution characterisation of microstructures, especially surfaces and interfaces. Prior to acquiring the NanoMEGAS system, the lab encountered limitations in quantitatively interpreting the nanoscale structural changes that occurred during tribological processes. Precession Electron Diffraction (PED) provided a breakthrough …
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