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Sigray QuantumLeap-V210 X-Ray Absorption Spectroscopy (XAS) System
First laboratory XAS with low Z capabilities and microspot analysis
Microspot Transmission Mode XAS system with spot sizes down to 100um diameter. The system is designed in a vacuum enclosure and, predominantly, useful for light element (S, P etc…) analysis through use of dispersive geometry and optional XES mode.
Switching between 2 geometries to allow for high resolution (<1 eV), low flux, XANES measurements and low resolution (<10 eV), high flux, EXAFS measurements
Synchrotron-like Performance in a Laboratory XAS System
The system’s performance is the culmination of several major design innovations, including:
- Patented acquisition with parallel detection spectrometer, making use of modern crystal and detector technology
- Novel x-ray double paraboloidal optics that removes higher order harmonic contamination, to allow for maximum source efficiency to be utilised
- Patented ultra-high brightness x-ray microfocus source, with multiple target materials in the same source body, that enables use of high efficiency, low diffraction orders of the crystal analysers, for improving acquisition speed and reducing signal contamination.
- The microstructured target material structure and liquid cooling functionality improves thermal dissipation
- High, spatially resolving, DQE direct detection CCD detector with high resolution and multi-frame readout capability
XAS GALLERY LINKS:
FEATURES
Specialised for low atomic number analysis and micro-XAS:
- Wide energy coverage, with low energy coverage: 1.7 – 10 keV due to a vacuum enclosure, enabling coverage of elements such as P and S not possible in ambient conditions
- Sub-eV (<0.7eV) energy resolution
- Micro-XANES mapping at 100 µm
- Recipe acquisition for unsupervised overnight runs
- Patented acquisition approach to optimize XAS spectra at highest throughput
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Comparison
SPECIFICATIONS
| Parameter | Specification | |
|---|---|---|
| Overall | Energy Coverage | 1.7 to 10 keV |
| XAS Acquisition | Transmission mode | |
| Energy Resolution | 0.5 eV in XANES <10 eV in EXAFS (Note that you can also use XANES mode to acquire high resolution EXAFS at 0.5 eV) |
|
| Beam Path | Enclosed in vacuum | |
| Focus at Sample | 100 μm diameter spot | |
| Source | Type | Sigray patented ultrahigh brightness sealed microfocus source |
| Target(s) | W and Mo standard. Others available upon request. |
|
| Power | Voltage | 300W | 20-50 kVp | |
| X-ray Optic | Type | Sigray proprietary double paraboloidal x-ray mirror lens |
| Transmission Efficiency | ~80% | |
| Magnification | 1:1 magnification | |
| Interior Coating | Platinum for increasing collection efficiency of optic. Others available upon request (e.g. Iridium coating for analyzing Pt). |
|
| X-ray Crystals | Type | HAPG/HOPG Ge (220) Single Crystal Ge (400) Single Crystal Fourth Crystal of Ge(111) provided if low energy (2.1 keV) operation is of interest |
| X-ray Detector | Type | Spatially resolving (pixelated detector) |
| Dimensions | Footprint | 42″ W x 95″ H x 75″ D |
| Additional Capabilities | Multiple Sample Holder | Holds up to 16 samples of ~3mm diameter each |
