25th Annual J. A. Woollam Spectroscopic Ellipsometry Workshop
Are you ready to push the boundaries of your research? Join leading experts and fellow innovators at our upcoming Spectroscopic Ellipsometry Workshop, where our senior applications engineers will take you inside the latest breakthroughs transforming industries.
In this immersive one-day event, you’ll explore how state-of-the-art ellipsometers are driving new possibilities across high-impact fields—from optimising semiconductor fabrication at the nanoscale, to engineering stealth coatings for advanced defense applications. Learn how precision thin-film analysis is shaping the materials of tomorrow, and how spectroscopic ellipsometry is enabling unprecedented control, accuracy, and insight.
Scroll down for a sneak peek into how J. A. Woollam ellipsometers are already being used in this field.
How Tyndall National Institute is using Spectroscopic Ellipsometry
The Tyndall National Institute, based in Cork, is a leading European research centre focused on advanced electronics, photonics, and materials science.
“At Tyndall National Institute, we utilise the J.A. Woollam M-2000UI Spectroscopic Ellipsometer for comprehensive thin-film analysis within our cleanroom laboratories. This system plays a vital role in both research and process development, enabling us to extract precise optical constants (n, k) and film thickness across a wide range of materials used in photonics, semiconductors, and nanotechnology.”
Samira Jastan, PhD student at Tyndall National Institute/ MTU-CAPPA
FREE Defence Magazine
This magazine celebrates the minds and missions behind cutting-edge technologies and strategic advancements that are reshaping how we protect our nations and support global stability. From breakthrough materials and autonomous systems to cyber defence and intelligence capabilities, R&D is not just responding to the world’s evolving threats—it’s proactively shaping a future where peace, safety, and strength can thrive together.
Ellipsometer for thin films and bulk materials characterisation
The IR-VASE® is the first and only spectroscopic ellipsometer to combine the chemical sensitivity of FTIR spectroscopy with thin film sensitivity of spectroscopic ellipsometry. The IR-VASE covers the wide spectral range from 1.7 to 30 microns (333 to 5900 wavenumbers). It is used to characterise both thin films and bulk materials in research and industry. This rapidly growing technology is finding uses in the optical coatings, semiconductor, biological and chemical industries, as well as research labs.
J. A. Woollam IR VASE II Spectroscopic Ellipsometer
QDUKI Ellipsometry for Stealth Coating
Stealth technology relies on reducing the detectability of objects—particularly to radar and infrared (IR) sensors—by manipulating surface materials to minimise reflected and emitted signals. A critical tool in developing and characterising such materials is the J.A. Woollam IR-VASE II spectroscopic ellipsometer, a sophisticated instrument designed for precise, non-destructive optical measurements in the infrared range (1.7 to 30+ microns). This capability makes it particularly valuable for assessing and engineering stealth coatings.
ALL APPLICATIONS
Defence and Security
Aerospace
Quantum Science and Technology
Space and Astronomy
Semiconductors
Agriculture
Non-Destructive Testing
