J.A. Woollam alpha 2.0 Spectroscopic Ellipsometer

Ellipsometer for spectral range of 400-1000 nm

The alpha 2.0 is a budget-friendly option for routine measurements of thin film thickness and refractive index. A compact footprint and simple design make the alpha 2.0 easy to use while harnessing the power of spectroscopic ellipsometry. It was designed for ease-of-use: simply place the sample on the stage, choose the model that matches your film, click “measure”, and you will have results within seconds.

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FEATURES

Easy-to-Use
Push-button operation is complemented by advanced
software that takes care of the work for you.
Powerful
Proven spectroscopic ellipsometer technology gives you
both thickness and refractive index with much higher
certainty than other techniques.
+Flexible
It works with your materials – dielectrics,
semiconductors, organics, and more.
Affordable
A streamlined instrument created for research and
development of simple samples.
Fast
Simultaneous collection of 190 wavelengths for highspeed, multi-angle ellipsometry measurements.

SPECIFICATIONS

Spectral Range	400 nm to 1000 nm, 190 wavelengths
Angle of Incidence	• Manual adjustment • 65°, 70°, 75°, or 90° (straight-through)
System Overview	• Dual-Rotation optical design • CCD detection • Automated sample alignment
Sample Size	The alpha 2.0 accommodates samples up to 200-mm diameter and 16-mm thick.
Data Acquisition Rate	• 5-10 seconds for full spectrum [typical]
Software	CompleteEASE for data acquisition, data analysis, and optical simulations
Beam Diameter	• Focused: < 1 mm